Patent Assignment
Reel/Frame 037854/0038
Assignment of Assignor's Interest
Recorded: 2016-02-29
Pages: 2
Assignor
ANZOU, KENICHI
Executed: 2016-02-19
Assignee
KABUSHIKI KAISHA TOSHIBA
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-8001, JAPAN
Covered Property
(1)
Semiconductor Integrated Circuit and Test Method Thereof