Patent Assignment
Reel/Frame 038029/0301
Assignment of Assignor's Interest
Recorded: 2016-03-18
Pages: 7
Assignors
FOURNIER, ADAM
Executed: 2016-03-15
KRESZOWSKI, DOUGLAS
Executed: 2016-03-15
PUEHL III, CARL
Executed: 2016-03-15
Assignee
HEMLOCK SEMICONDUCTOR CORPORATION
12334 GEDDES ROAD, HEMLOCK, MICHIGAN, 48626
Covered Property
(1)
Low Impurity Detection Method for Characterizing Metals Within a Surface and Sub-Surface of Polycrystalline Silicon
Application:
15/074,091 →
Publication:
US 2017/0269004
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.