Patent Assignment
Reel/Frame 038160/0726
Assignment of Assignor's Interest
Recorded: 2016-03-31
Pages: 2
Assignee
HITACHI HIGH-TECH SCIENCE CORPORATION
24-14, NISHI-SHIMBASHI 1-CHOME, MINATO-KU, TOKYO, 105-0003, JAPAN
Covered Property
(1)
Scanning Probe Microscope and Measurement Range Adjusting Method for Scanning Probe Microscope