Assignment of Assignor's Interest

Recorded: 2016-04-15 Pages: 2

Assignor

ISHII, TAKASHI

Executed: 2016-03-24

Assignee

KABUSHIKI KAISHA TOSHIBA

1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, JAPAN

Covered Property (1)

Charged Particle Beam Apparatus and Method of Calibrating Sample Position

Application: 15/066,536 →

Publication: US 2016/0336143

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.