Patent Assignment
Reel/Frame 040174/0920
Assignment of Assignor's Interest
Recorded: 2016-10-31
Pages: 3
Assignor
SAKAGUCHI, KAORU
Executed: 2016-10-06
Assignee
SEIKO INSTRUMENTS INC.
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA-KEN, 261-8507, JAPAN
Covered Property
(1)
Semiconductor Device and Method of Inspecting a Semiconductor Device
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.
Corrective Assignment to Correct the Name of Receiving Party in a Coversheet Previously Recorded on Reel 040174 Frame 0920. Assignor(S) Hereby Confirms the Name of Receiving Party in the Coversheet Previously Recorded Was Incorrectly Entered..
May 24, 2017
From: SAKAGUCHI, KAORU
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 042556/0862 →
Change of Name
Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →