IP Library Assignment 041596/0630
Patent Assignment
Reel/Frame 041596/0630

Assignment of Assignor's Interest

Recorded: 2017-03-16 Pages: 6
Assignors
KELLERMAN, PETER L.
Executed: 2017-03-06
MORADIAN, ALA
Executed: 2017-03-06
SINCLAIR, FRANK
Executed: 2017-03-06
Assignee
VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
35 DORY ROAD, GLOUCESTER, MASSACHUSETTS, 01930
Covered Property (1)
System for Measuring Material Thicknesses at High Temperatures
Application: 15/511,783 →
Publication: US 2017/0247810
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Dec 11, 2019
From: APPLIED MATERIALS, INC.
To: LEADING EDGE CRYSTAL TECHNOLOGIES, INC.
Reel/Frame 051247/0716 →
Acquisition Jan 15, 2020
From: VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
To: APPLIED MATERIALS, INC.
Reel/Frame 051973/0106 →