Patent Assignment
Reel/Frame 043132/0230
Assignment of Assignor's Interest
Recorded: 2017-07-28
Pages: 3
Assignor
NAKASHIMO, TAKASHI
Executed: 2016-11-14
Assignee
SII SEMICONDUCTOR CORPORATION
8, NAKASE 1-CHOME, MIHAMA-KU, CHIBA-SHI, CHIBA, 261-8507, JAPAN
Covered Property
(1)
Method of Measuring Characteristics of a Protection Circuit for a Linear Voltage Regulator
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Jun 10, 2014
From: YAHAGI, AKIHITO; IMURA, TAKASHI
To: SEIKO INSTRUMENTS INC.
Reel/Frame 033064/0709 →
Assignment of Assignor's Interest
Feb 11, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION .
Reel/Frame 037783/0166 →
Corrective Assignment to Correct the Execution Date Previously Recorded at Reel: 037783 Frame: 0166. Assignor(S) Hereby Confirms the Assignment.
Feb 23, 2016
From: SEIKO INSTRUMENTS INC
To: SII SEMICONDUCTOR CORPORATION
Reel/Frame 037903/0928 →
Change of Name
Mar 12, 2018
From: SII SEMICONDUCTOR CORPORATION
To: ABLIC INC.
Reel/Frame 045567/0927 →