Patent Assignment
Reel/Frame 044431/0868
Assignment of Assignor's Interest
Recorded: 2017-12-19
Pages: 4
Assignors
LIN, MENG-HAN
Executed: 2017-11-06
LIANG, CHIA-LIN
Executed: 2017-11-06
HSIEH, CHIH-REN
Executed: 2017-11-06
Assignee
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
NO. 8, LI-HSIN RD. 6, SCIENCE BASED INDUSTRIAL PARK, HSINCHU, 300, TAIWAN
Covered Property
(1)
Method for Testing Bridging in Adjacent Semiconductor Devices and Test Structure