Patent Assignment
Reel/Frame 044544/0672
Assignment of Assignor's Interest
Recorded: 2018-01-05
Pages: 4
Assignor
KIM, GYEONGSEOP
Executed: 2017-12-26
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Method and System for Measuring Pattern Placement Error on a Wafer