Patent Assignment
Reel/Frame 045043/0156
Merger
Recorded: 2018-02-26
Pages: 4
Assignor
REVERA INCORPORATED
Executed: 2017-11-08
Assignee
NOVA MEASURING INSTRUMENTS INC.
3090 OAKMEAD VILLAGE DRIVE, SANTA CLARA, CALIFORNIA, 95051
Covered Properties
(2)
Methods and Systems for Measuring Periodic Structures Using Multi-Angle X-Ray Reflectance Scatterometry (Xrs)
Silicon Germanium Thickness and Composition Determination Using Combined Xps and Xrf Technologies
Related Assignments
(2)
Other recorded transfers of the patents in this record — the chain of ownership.