IP Library Assignment 045233/0407
Patent Assignment
Reel/Frame 045233/0407

Assignment of Assignor's Interest

Recorded: 2018-02-01 Pages: 7
Assignor
FOGALE NANOTECH
Executed: 2017-01-11
Assignee
UNITY SEMICONDUCTOR
611 RUE ARISTIDE BERGÈS, ZAC DE PRÉ MILLET, MONTBONNOT-SAINT-MARTIN, F-38330, FRANCE
Covered Properties (3)
Method for Extracting Non-Periodical Patterns Masked by Periodical Patterns, and Device Implementing the Method
Application: 15/325,684 →
Publication: US 2017/0161887
Device and Method for Surface Profilometry for the Control of Wafers During Processing
Patent: 9,958,261 →
Application: 15/513,524 →
Publication: US 2017/0299376
Device and Method for Detecting Defects in Bonding Zones Between Samples Such as Wafers
Application: 15/556,988 →
Publication: US 2018/0059032
Related Assignments (3)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 11, 2017
From: THOUY, BENOIT
To: FOGALE NANOTECH
Reel/Frame 040950/0533 →
Assignment of Assignor's Interest Mar 22, 2017
From: FRESQUET, GILLES
To: FOGALE NANOTECH
Reel/Frame 041688/0615 →
Nunc Pro Tunc Assignment Dec 17, 2019
From: PERROT, SYLVAIN
To: FOGALE NANOTECH
Reel/Frame 051310/0341 →