Patent Assignment
Reel/Frame 047425/0647
Assignment of Assignor's Interest
Recorded: 2018-11-06
Pages: 6
Assignors
KIM, MIN-WOO
Executed: 2018-08-29
LEE, CHANG-HO
Executed: 2018-08-29
CHOI, JIN-HO
Executed: 2018-08-29
Assignee
SAMSUNG ELECTRONICS CO., LT.
129, SAMSUNG-RO, YEONGTONG-GU, SUWON-SI, GYEONGGI-DO, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Test Chamber for Memory Device, Test System for Memory Device Having the Same and Method of Testing Memory Devices Using the Same