IP Library › Assignment 047645/0689
Patent Assignment
Reel/Frame 047645/0689

Assignment of Assignor's Interest

Recorded: 2018-11-30 Pages: 5
Assignors
LIN, MENG-HAN
Executed: 2017-11-06
LIANG, CHIA-LIN
Executed: 2017-11-06
HSIEH, CHIH-REN
Executed: 2017-11-06
Assignee
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
NO. 8, LI-HSIN RD. 6, SCIENCE-BASED INDUSTRIAL PARK, HSINCHU, 300, TAIWAN
Covered Property (1)
Method for Testing Bridging in Adjacent Semiconductor Devices and Test Structure
Application: 16/206,771 →
Publication: US 2019/0115266
Related Assignments (1)
Other recorded transfers of the patent in this record — the chain of ownership.
Corrective Assignment to Correct the Spelling of the Assignee's Name Previously Recorded on Reel 047645 Frame 0689. Assignor(S) Hereby Confirms the Assignment. Dec 10, 2018
From: LIN, MENG-HAN; LIANG, CHIA-LIN; HSIEH, CHIH-REN
To: TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
Reel/Frame 047762/0407 →