Patent Assignment
Reel/Frame 048940/0770
Assignment of Assignor's Interest
Recorded: 2019-04-19
Pages: 4
Assignor
LEI, MING
Executed: 2019-01-25
Assignee
FEMTOMETRIX, INC.
2815 MCGAW AVENUE, IRVINE, CALIFORNIA, 92614
Covered Properties
(5)
Test Structure Design for Detection of Process Induced Charging by Optical Second Harmonic Generation
Application:
62/663,924 →
Parametric Modeling for Interfacial Electric Properties by Shg Measurement
Application:
62/663,925 →
Methods to Evaluate Patterned Wafer by Optical Second Harmonic Generation
Application:
62/663,942 →
System Design for Hybrid-Polarization Optical Second Harmonic Generation
Application:
62/671,611 →
Second Harmonic Generation (Shg) Imaging Based Optical Inspection System Design
Application:
62/671,616 →