Patent Assignment
Reel/Frame 050293/0448
Assignment of Assignor's Interest
Recorded: 2019-09-06
Pages: 4
Assignors
IKEDA, TAKAHIRO
Executed: 2019-08-28
KURAMOTO, AKIRA
Executed: 2019-08-29
AKUTSU, HARUKO
Executed: 2019-09-02
Assignee
TOSHIBA MEMORY CORPORATION
1-1, SHIBAURA 1-CHOME, MINATO-KU, TOKYO, 105-0023, JAPAN
Covered Property
(1)
Atom Probe Inspection Device, Field Ion Microscope, and Distortion Correction Method
Related Assignments
(1)
Other recorded transfers of the patent in this record — the chain of ownership.