Patent Assignment
Reel/Frame 050841/0742
Assignment of Assignor's Interest
Recorded: 2019-10-28
Pages: 6
Assignee
SAMSUNG ELECTRONICS CO., LTD.
129, SAMSUNG-RO, YEONGTONG-GU, GYEONGGI-DO, SUWON-SI, 16677, KOREA, REPUBLIC OF
Covered Property
(1)
Wafer Level Methods of Testing Semiconductor Devices Using Internally-Generated Test Enable Signals