Patent Assignment
Reel/Frame 051500/0419
Assignment of Assignor's Interest
Recorded: 2020-01-13
Pages: 6
Assignors
LEE, WEI TI
Executed: 2019-04-07
POIS, HEATH
Executed: 2019-06-03
KLARE, MARK
Executed: 2019-08-10
BOZDOG, CORNEL
Executed: 2018-06-11
Assignee
NOVA MEASURING INSTRUMENTS, INC.
3090 OAKMEAD VILLAGE DRIVE, SANTA CLARA, CALIFORNIA, 95051
Covered Property
(1)
Method and System for Non-Destructive Metrology of Thin Layers