Assignment of Assignor's Interest

Recorded: 2020-03-26 Pages: 6

Assignors

STRESHINSKY, MATTHEW AKIO

Executed: 2017-02-06

NOVACK, ARI

Executed: 2017-02-06

HOCHBERG, MICHAEL J.

Executed: 2017-02-13

Assignee

ELENION TECHNOLOGIES, LLC

171 MADISON AVENUE, SUITE 1100, NEW YORK, NEW YORK, 10016

Covered Property (1)

Methods, Test Structures, and Test Systems for Determining a Surface Characteristic of a Chip Facet

Application: 16/830,399 →

Publication: US 2020/0225168

Related Assignments (1)

Other recorded transfers of the patent in this record — the chain of ownership.