Patent Assignment
Reel/Frame 054674/0210
Assignment of Assignor's Interest
Recorded: 2020-12-16
Pages: 6
Assignee
KLA CORPORATION
ONE TECHNOLOGY DRIVE, MILPITAS, CALIFORNIA, 95035
Covered Properties
(2)
Projection and Distance Segmentation Algorithm for Wafer Defect Detection
Projection and Distance Segmentation (PDS) Algorithm for Wafer Defect Detection
Application:
62/959,066 →