Patent Assignment
Reel/Frame 069560/0973
SECURITY INTEREST
Recorded: 2024-11-04
Received: 2024-11-04
Pages: 10
Assignor
FEMTOMETRIX, INC.
Executed: 2024-08-29
Assignee
KNOBBE, MARTENS, OLSON & BEAR, LLP
2040 MAIN ST., 14TH FLOOR, IRVINE, CA, 92614, UNITED STATES
Covered Applications
(21)
COMBINATION THERAPY WITH AN ANTI-AXL ANTIBODY-PBD CONJUGATE AND NANOCUPS
App. No. 18/837,459
→
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
App. No. 18/641,170
→
METHOD AND APPARATUS FOR SEPARATION OF THE SECOND HARMONIC GENERATION COMPONENTS, THROUGH VARIATION IN THE INPUT PROBING LASER POLARIZATION
App. No. 18/462,208
→
METHOD AND APPARATUS FOR MAIN DETECTOR SYNCHRONIZATION OF OPTICALLY BASED SECOND HARMONIC GENERATION MEASUREMENTS
App. No. 18/462,073
→
METHOD AND APPARATUS FOR NON-INVASIVE SEMICONDUCTOR TECHNIQUE FOR MEASURING DIELECTRIC/SEMICONDUCTOR INTERFACE TRAP DENSITY USING SCANNING ELECTRON MICROSCOPE CHARGING
App. No. 18/350,643
→
METHOD AND APPARATUS FOR NON-INVASIVE, NON-INTRUSIVE, AND UN-GROUNDED, SIMULTANEOUS CORONA DEPOSITION AND SHG MEASUREMENTS
App. No. 18/350,249
→
APPARATUS AND METHOD OF INCREASING PRECISION CONTROL OF CHARGE DEPOSITION ONTO A SEMICONDUCTOR WAFER SUBSTRATE
App. No. 18/350,250
→
DIMENSIONAL METROLOGY USING NON-LINEAR OPTICS
App. No. 18/335,485
→
SECOND-HARMONIC GENERATION FOR CRITICAL DIMENSIONAL METROLOGY
App. No. 17/743,284
→
WAFER METROLOGY TECHNOLOGIES
App. No. 17/667,404
→
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
App. No. 17/454,759
→
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
App. No. 17/449,077
→
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
App. No. 16/841,324
→
WAFER METROLOGY TECHNOLOGIES
App. No. 16/773,693
→
FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY
App. No. 16/703,709
→
SECOND HARMONIC GENERATION (SHG) OPTICAL INSPECTION SYSTEM DESIGNS
App. No. 16/412,216
→
SYSTEMS AND METHODS FOR DETERMINING CHARACTERISTICS OF SEMICONDUCTOR DEVICES
App. No. 16/396,455
→
PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGY
App. No. 15/882,433
→
WAFER METROLOGY TECHNOLOGIES
App. No. 15/806,271
→
FIELD-BIASED SECOND HARMONIC GENERATION METROLOGY
App. No. 15/799,594
→
SYSTEMS FOR PARSING MATERIAL PROPERTIES FROM WITHIN SHG SIGNALS
App. No. 14/939,750
→