IP Library Granted Patent US 11,410,581
Granted Patent B2
US 11,410,581 · App. 17/066,584 · Granted Aug 9, 2022

Electro-optical apparatus

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Quick Facts
Patent No.
US 11,410,581
App. No.
17/066,584
Filed
Oct 9, 2020
Granted
Aug 9, 2022
Kind
B2
Art Unit
2621
USPC
345/214
Abstract

A display apparatus includes: an inspection TFT of which a drive output of a gate driver circuit is connected to a gate electrode and a drive output of a source driver circuit is connected to a source electrode; and an abnormality detection circuit unit that receives an output from a drain electrode of the inspection TFT to detect an abnormality of the gate driver circuit or the source driver circuit, and, in a period in which the drive output of the gate driver circuit is high, the abnormality detection circuit unit determines as abnormal when an output voltage from the drain electrode of the inspection TFT is out of a predetermined voltage range.

Claims (28)

1. An electro-optical apparatus comprising:

an array substrate including a display region in which scanning signal lines and image signal lines are arranged in a matrix, and pixel switch elements and pixel electrodes are formed at intersections of the scanning signal lines and the image signal lines, respectively;

an electro-optical layer arranged corresponding to the display region; and

a scanning signal line drive circuit that drives the scanning signal lines and an image signal line drive circuit that drives the image signal lines, the scanning signal line drive circuit and the image signal line drive circuit being arranged in a peripheral portion of the display region,

the electro-optical apparatus further comprising:

an inspection switch element of which a control electrode is directly connected to a drive output of the scanning signal line drive circuit, and one current electrode is directly connected to a drive output of the image signal line drive circuit; and

an abnormality detection circuit unit that receives an output directly from another current electrode of the inspection switch element to detect an abnormality of the scanning signal line drive circuit or the image signal line drive circuit, wherein

the abnormality detection circuit unit outputs an abnormality signal when an output voltage from the another current electrode of the inspection switch element is outside a predetermined voltage range during an activation period of the drive output of the scanning signal line drive circuit.

2. The electro-optical apparatus according to claim 1 , wherein

the inspection switch element is formed in a same process as the pixel switch element.

3. The electro-optical apparatus according to claim 1 , wherein

the drive output of the scanning signal line drive circuit of a final stage or subsequent stages with respect to a scanning direction is connected to the inspection switch element, and a drive output of the image signal line drive circuit of a final stage or subsequent stages with respect to a scanning direction is connected to the inspection switch element.

4. The electro-optical apparatus according to claim 1 , wherein

the inspection switch element is connected to both a drive output of a scanning start side and a drive output of a scanning end side of the scanning signal line drive circuit, and to both a drive output of a scanning start side and a drive output of a scanning end side of the image signal line drive circuit, and

an output of the inspection switch element selected according to switching of a scanning direction of the scanning signal line drive circuit and the image signal line drive circuit is input to the abnormality detection circuit unit.

5. The electro optical apparatus according to claim 1 , wherein,

of the drive output of the image signal line drive circuit, the drive output not connected to the display region is connected to one current electrode of the inspection switch element, and

the drive output connected to the one current electrode of the inspection switch element changes for each frame.

6. The electro optical apparatus according to claim 1 , wherein,

abnormality detection by the abnormality detection circuit unit is performed within a vertical blanking period.

7. The electro-optical apparatus according to claim 1 , wherein

the drive output of the scanning signal line drive circuit of a final stage with respect to a scanning direction is connected to a control electrode of the inspection switch element.

8. The electro-optical apparatus according to claim 1 , wherein

the inspection switch element is a single transistor.

9. The electro-optical apparatus according to claim 1 , wherein

the control electrode of the inspection switch element receives an input directly from the scanning signal line driver circuit;

the one current electrode of the inspection switch element directly acquires a signal from the image signal line drive circuit; and

the abnormality detection circuit unit receives an output directly from the another current electrode of the inspection switch element.