IP Library Granted Patent US 11,905,601
Granted Patent B2
US 11,905,601 · App. 16/793,675 · Granted Feb 20, 2024

High temperature imaging media for digital image correlation

Inventors: Michael L. Hribernik (Jupiter, FL); Fred K. Haake (Palm Beach Gardens, FL)
Assignee: RTX CORPORATION
C23C4/08C23C4/10C23C8/00C23C28/321C23C28/322C23C28/345C23C28/3455G01L5/0047G01N3/00G01N25/005Y10T428/2495Y10T428/24975
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 11,905,601
App. No.
16/793,675
Filed
Feb 18, 2020
Granted
Feb 20, 2024
Kind
B2
Examiner
HA, NGUYEN Q
Art Unit
2853
USPC
73/800
Abstract

A thermal barrier coating is provided. The thermal barrier coating is configured to remain adherent to a substrate under high strains, thus allowing the use of non-contacting strain measurement systems, using digital image correlation for example. The thermal barrier coating may include a first layer of a partially metallic material configured to adhere to a metallic substrate, and a second layer of a partially ceramic material configured to adhere to the first layer. A successful configuration has a top layer thickness that is approximately two-thirds of the first layer thickness.

Claims (15)

1. A method of measuring strain in a metallic substrate, the method comprising applying digital image correlation to a metallic substrate having a thermal barrier coating wherein the thermal barrier coating comprises a bond layer disposed on the metallic substrate and a top layer disposed on the bond layer,

wherein the thermal barrier coating further comprises a thermally grown oxide layer disposed between the bond layer and the top layer.

2. The method of claim 1 , wherein the bond layer has a thickness and the top layer has a thickness and the thickness of the top layer is two thirds of the bond layer thickness of the bond layer.

3. The method of claim 1 , wherein the bond layer has a thickness of 0.003 inches and the top layer has a thickness of 0.002 inches.

4. The method of claim 1 , wherein the top layer comprises yttria-stabilized zirconia.

5. The method of claim 1 , wherein the top layer comprises alumina.

6. The method of claim 1 , wherein digital image correlation is applied after the substrate and thermal barrier coating are subjected to a temperature of 1400° F. and a strain of 10-30%.

7. The method of claim 1 , wherein digital image correlation is applied after the substrate and thermal barrier coating are subjected to a temperature of 1400° F. to 1600° F. and a strain of 30-40%.

8. A method of measuring strain in a metallic substrate, the method comprising applying digital image correlation to a metallic substrate having a thermal barrier coating wherein the thermal barrier coating comprises a bond layer disposed on the metallic substrate and a top layer disposed on the bond layer and the top layer has a thickness that is two thirds of a thickness of the bond layer,

wherein the top layer comprises yttria-stabilized zirconia or alumina.

9. The method of claim 8 , wherein the bond layer has a thickness of 0.003 inches and the top layer has a thickness of 0.002 inches.

10. The method of claim 8 , wherein the top layer comprises yttria-stabilized zirconia.

11. The method of claim 8 , wherein the top layer comprises alumina.

12. The method of claim 8 , wherein digital image correlation is applied after the substrate and thermal barrier coating are subjected to a temperature of 1400° F. and a strain of 10-30%.

13. The method of claim 8 , wherein digital image correlation is applied after the substrate and thermal barrier coating are subjected to a temperature of 1400° F. to 1600° F. and a strain of 30-40%.