Data storage device and method for read disturb mitigation during low-power modes

1. A data storage device comprising:

a memory; and

one or more processors, individually or in combination, configured to:

receive a command from a host to exit a low-power mode; and

in response to receiving the command from the host to exit the low-power mode:

use firmware randomization logic to perform a randomization process to randomly select a single wordline from a set of wordlines in the memory designated for an active read scan;

perform a bit error rate (BER) check on the randomly-selected single wordline and its two directly adjacent neighbor wordlines;

determine whether there is a BER failure on the randomly-selected single wordline or its two directly adjacent neighbor wordlines; and

in response to determining that there is a BER failure on the randomly-selected single wordline or its two directly adjacent neighbor wordlines, perform a BER estimation scan (BES) of the memory.

2. The data storage device of claim 1 , wherein a different wordline is randomly selected from the set of wordlines each time of a plurality of times that the command to exit the low-power mode is received.

3. The data storage device of claim 1 , wherein the one or more processors, individually or in combination, are further configured to:

in response to determining that there is a BER failure on the randomly-selected single wordline or its two directly adjacent neighbor wordlines, relocate the block containing the randomly-selected single wordline or its two directly adjacent neighbor wordlines.

4. The data storage device of claim 1 , wherein the one or more processors, individually or in combination, are further configured to:

in response to determining that there is no BER failure on the randomly-selected single wordline or its two directly adjacent neighbor wordlines, perform an initialization process.

5. The data storage device of claim 1 , wherein the one or more processors, individually or in combination, are further configured to:

determine the set of wordlines in the memory designed for the active read scan.

6. The data storage device of claim 1 , wherein the memory comprises a three-dimensional memory.

7. In a data storage device comprising a memory, a method comprising:

each time of a plurality of times that the data storage device transitions from a low-power mode to an active mode:

using firmware randomization logic to perform a randomization process to randomly selecta single wordline in the memory, wherein a different single wordline is randomly selected in response to each time of the plurality of times;

determining whether a number of errors in the randomly-selected single wordline is above a threshold;

in response to determining that the number of errors in the randomly-selected single wordline is above the threshold, relocating data in the randomly-selected single wordline to another wordline in the memory;

determining whether a number of errors in two directly adjacent neighbor wordlines of the randomly-selected single wordline is above the threshold; and

in response to determining that the number of errors in the two directly adjacent neighbor wordlines of the randomly-selected single wordline is above the threshold, relocating data in the two directly adjacent neighbor wordlines to other wordlines in the memory.

8. The method of claim 7 , wherein data in a block containing the randomly-selected single wordline is relocated to a different block.

9. The method of claim 7 , wherein a bit error rate (BER) check is used to determine whether the number of errors in the randomly-selected single wordline is above the threshold.

10. The method of claim 7 , wherein the randomly-selected single wordline is randomly selected from a subset of wordlines that are considered relatively-more prone to error than other wordlines in the memory.

11. The method of claim 10 , further comprising:

determining which wordlines in the memory are contained in the subset of wordlines.

12. The method of claim 7 , further comprising:

using an exclusive-or handling process to recover data in the two directly adjacent neighbor wordlines.

13. The method of claim 7 , further comprising:

correcting error(s) in the randomly-selected single wordline.

14. The method of claim 7 , further comprising:

using an active read scan (ARS) to detect error(s) in the randomly-selected single wordline.

15. The method of claim 7 , further comprising:

in response to determining that the number of errors in the randomly-selected single wordline is above the threshold, performing a bit error rate (BER) estimation scan (BES) of the memory.

16. The method of claim 7 , further comprising:

in response to determining that the number of errors in the randomly-selected single wordline is not above the threshold, performing an initialization process.

17. The method of claim 7 , wherein the memory comprises a three-dimensional memory.

18. A data storage device comprising:

a memory; and

means for:

receiving a command from a host to exit a low-power mode; and

in response to receiving the command from the host to exit the low-power mode:

using firmware randomization logic to perform a randomization process to randomly select a single wordline from a set of wordlines in the memory designated for an active read scan;

performing a bit error rate (BER) check on the randomly-selected single wordline and its two directly adjacent neighbor wordlines;

determining whether there is a BER failure on the randomly-selected single wordline or its two directly adjacent neighbor wordlines; and

in response to determining that there is a BER failure on the randomly-selected single wordline or its two directly adjacent neighbor wordlines performing a BER estimation scan (BES) of the memory.