IP Library Granted Patent US 12661083
Granted Patent B2
US 12661083 · App. 18/789,440 · Granted Jun 23, 2026

Systems and methods for a calibration phantom holder

Inventors: Sam Maule (Hartford, WI); Mason Dieck (Waukesha, WI); Michelle Marie Severino DeLong Samalik (Franklin, WI); Chelsey Amanda Lewis (Waukesha, WI)
Assignee: GE PRECISION HEALTHCARE LLC
A61B6/583A61B6/0407A61B6/4241
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Quick Facts
Patent No.
US 12661083
App. No.
18/789,440
Granted
Jun 23, 2026
Kind
B2
Abstract

A calibration phantom holder for an imaging system is provided. In one example, the calibration phantom holder includes a horizontal member with a plurality of parallel slots distributed along an upper surface of the horizontal member. Each parallel slot of the plurality of parallel slots is configured to support one or more calibration phantoms. The calibration phantom holder includes a vertical member perpendicularly coupled to the horizontal member. The vertical member configured to couple to a support system of the imaging system.

Claims (31)

1 . A calibration phantom holder for an imaging system comprising:

a horizontal member comprising a plurality of parallel slots distributed along an upper surface of the horizontal member, each parallel slot of the plurality of parallel slots configured to support one or more calibration phantoms; and

a vertical member perpendicularly coupled to the horizontal member, the vertical member configured to couple to a support system of the imaging system.

2 . The calibration phantom holder of claim 1 , wherein the calibration phantom holder comprises a nonmetallic material.

3 . The calibration phantom holder of claim 1 , wherein the one or more calibration phantoms comprise a slotted slab.

4 . The calibration phantom holder of claim 3 , wherein the horizontal member is configured to support a plurality of slotted slabs arranged vertically one on top of another.

5 . The calibration phantom holder of claim 3 , wherein the horizontal member is configured to support a plurality of slotted slabs arranged horizontally side by side.

6 . The calibration phantom holder of claim 3 , wherein the horizontal member is configured to support a plurality of slotted slabs arranged horizontally side by side and vertically one on top of another.

7 . The calibration phantom holder of claim 1 , wherein each parallel slot of the plurality of parallel slots includes one or more detents.

8 . The calibration phantom holder of claim 1 , wherein each parallel slot of the plurality of parallel slots has a dovetailed profile.

9 . The calibration phantom holder of claim 1 , wherein the vertical member comprises one or more apertures configured to act as handles and is configured to couple to a cradle clamping holder, and the horizontal member comprises one or more apertures configured to act as handles.

10 . The calibration phantom holder of claim 1 , wherein the horizontal member comprises a first front and a back, the first front and the back being hexagonal in shape, and wherein the vertical member comprises a second front and a face, the face being recessed relative to the second front, and wherein the face of the vertical member is perpendicularly coupled to the back of the horizontal member.

11 . The calibration phantom holder of claim 10 , wherein the vertical member is perpendicularly coupled to the back of the horizontal member by a first dovetail inlet including a first joint and a second dovetail inlet including a second joint, and wherein the back of the horizontal member comprises a first joint cover and a second joint cover, the first joint cover positioned over the first joint and the second joint cover positioned over the second joint.

12 . An imaging system comprising:

a cradle;

a support system;

a calibration phantom holder comprising a horizontal member with a plurality of parallel slots distributed along an upper surface of the horizontal member, and a vertical member perpendicularly coupled to the horizontal member; and

one or more calibration phantoms configured to be supported by the plurality of parallel slots.

13 . The imaging system of claim 12 , wherein the one or more calibration phantoms comprise a slotted slab with an upper slot and a lower tab, the lower tab configured to slide into a corresponding slot of the plurality of parallel slots and the upper slot configured to support a second calibration phantom.

14 . The imaging system of claim 13 , wherein the slotted slab is configured to be one or both of stacked vertically one on top of the other and arranged horizontally side by side.

15 . The imaging system of claim 13 , wherein the slotted slab comprises an aperture configured to receive a rod inserted vertically through a stack, and wherein the rod is coupled to the horizontal member.

16 . A method for a calibration phantom holder for an imaging system comprising:

mounting a vertical member of the calibration phantom holder to a support system of the imaging system;

preparing one or more calibration phantoms;

positioning the calibration phantom holder into a bore of the imaging system; and

performing a calibration operation with the one or more calibration phantoms,

wherein preparing one or more calibration phantoms includes selecting a plurality of slotted slabs, and slotting one or more slotted slabs of the plurality of slotted slabs into one or more parallel slots of a horizontal member of the calibration phantom holder.

17 . The method of claim 16 , wherein performing the calibration operation comprises scanning the one or more calibration phantoms in a sequential order.

18 . The method of claim 16 , further comprising arranging one or more of the plurality of slotted slabs in one or more horizontal sections and vertically stacking one or more of the plurality of slotted slabs in a vertical stack in the one or more horizontal sections.

19 . The method of claim 18 , further comprising preparing a first calibration phantom comprising a first plurality of slotted slabs arranged in a first vertical stack, preparing a second calibration phantom comprising a second plurality of slotted slabs arranged in a second vertical, scanning the first calibration phantom, scanning the second calibration phantom, preparing a third calibration phantom comprising a third plurality of slotted slabs arranged in the first vertical stack, the third calibration phantom prepared by removing or adding one or more slotted slabs to the first calibration phantom, and scanning the third calibration phantom.

20 . The method of claim 16 , wherein the calibration phantom holder comprises a base material used in the calibration operation.