Sapphire microreactors
The present invention concerns the field of microreaction devices and of micro-process engineering. It particularly involves devices having micro-channels (internal chambers of micrometric to submicrometric dimensions) for conveying chemical or biochemical mixtures and/or reactions. More specifically, such devices are optimized to achieve high temperature and pressure stresses (i.e. 500° C. and 500 bar). For observation and analysis purposes, the microreaction devices have a wide range of transparency in terms of wavelengths. The subject matter of the present invention relates to a microfluid or microreactor device made of transparent sapphire, preferably in the wavelength range of 150 to 6500 nm, its manufacturing method and to its use.
1 . A microreactor made of transparent sapphire in the wavelength range from 150 to 6500 nm, wherein the sapphire is mono-crystalline and the c-plane is perpendicular to the microreactor surface.
2 . The microreactor according to claim 1 , further comprising a first wafer and a second wafer, wherein at least one of said wafers comprises at least one micro-channel.
3 . The microreactor according to claim 2 , wherein the micro-channel has an average depth H ranging from 0.1 to 500 μm.
4 . The microreactor according to claim 2 , wherein the micro-channel has an average width W ranging from 0.1 to 1000 μm.
5 . The microreactor according to claim 2 , wherein the ratio of wafer thickness/micro-channel depth is greater than or equal to 2.
6 . The microreactor according to claim 4 , wherein the total surface area of the at least one micro-channel, is less than or equal to half of the total wafer surface area.
7 . The microreactor according to claim 1 , having a volume of less than 500 μl.
8 . The microreactor according to claim 2 , wherein the ratio of wafer thickness/micro-channel depth is greater than or equal to 4.
9 . The microreactor according to claim 4 , wherein the minimum distance Z between two micro-channels, or between two parts of the same micro-channel is greater than or equal to W.
10 . The microreactor according to claim 1 , having a volume ranging from 0.5 to 500 μl.
11 . A process of manufacturing a sapphire microreactor according to claim 1 , comprising the steps of:
1) Etching at least one micro-channel on at least one wafer, and
2) assembling the etched wafer obtained in step 1) on a second etched or unetched wafer.
12 . The process according to claim 11 , wherein the etching step 1) further comprises the substeps of:
(a) printing an image of interest, by means of a resin, on at least one wafer, said wafer being covered by a layer of sacrificial material,
(b) chemical etching of the layer of sacrificial material present on the wafer,
(c) removing the residual resin layer, and
(d) chemical etching of the micro-channels according to the desired final depth.
13 . The process according to claim 11 , further comprising a step of drilling the inlet and/or outlet ports of the wafer(s).
14 . The process according to claim 11 , wherein the assembly of step 2) further comprises a pre-bonding step, wherein said pre-bonding step comprises at least one wafer cleaning step followed by pre-bonding in aqueous solution and then heat treatment in a press system.
15 . The process according to claim 14 , wherein the cleaning step is carried out by means of a solution of sulphuric acid (H 2 SO 4 ) and hydrogen peroxide (H 2 O 2 ), (4:1, v/v), followed by a rinsing with ultra-pure water at a temperature higher than or equal to 60° C. and a treatment in a phosphoric acid crystallizer at a temperature higher than or equal to 150° C.
16 . The process according to claim 14 , wherein the pre-bonding consists of bringing the wafers into contact with each other, with the etched side(s) on the inside, the set thus constituted is then heat treated at a temperature ranging from 200 to 300° C. and for a time ranging from 2 to 4 hours in a press system.
17 . The process according to claim 11 , wherein the assembly of step 2) is performed by the Spark Plasma Sintering (SPS) or Field Activated Sintering Technique (FAST) method.
18 . The method of claim 11 , wherein the etching is done by a photolithography method followed by chemical or plasma etching, or by direct laser writing method or machining.