Systems and methods for multi-surface profile estimation via optical coherence tomography

1 . An optical coherence tomography (OCT) system for profilometry measurements of a specimen, comprising:

an interferometer configured to interfere a reflected test beam that is reflected from the specimen with a reflected reference beam to produce an interference pattern;

a spectrometer configured to measure a spectrum of the interference pattern to produce measurements of intensities of the interference pattern corresponding to different wavelengths;

a computer-readable memory configured to store executable instructions; and

a processor configured to execute the executable instructions to:

determine noise statistics of the intensities of the interference pattern;

use the noise statistics to set a threshold for detecting a number of layers of the specimen penetrated by the test beam at a location of the specimen based on a pre-specified probability of false acceptance of noise as a signal; and

determine the profilometry measurements as an estimate of depths of the layers of the specimen causing the intensities of the interference pattern above the threshold.

2 . The OCT system of claim 1 , wherein to determine the noise statistics, the processor is configured to:

obtain a smooth estimate of the spectrum of the interference pattern defining mean values of the noise statistics for the different wavelengths;

group the wavelengths based on similarities of their mean values to produce groups of wavelengths;

compute a group variance estimate within each of the groups of wavelengths; and

assign the group variance estimate to each wavelength in a group of wavelengths of the groups of wavelengths.

3 . The OCT system of claim 2 , wherein the smooth estimate of the spectrum of the interference pattern is obtained from a spectrum of the reference beam.

4 . The OCT system of claim 1 , wherein the processor is configured to produce the estimate of the depths of the layers of the specimen using a greedy optimization.

5 . The OCT system of claim 1 , wherein the noise statistics of the intensities of the interference pattern include noise variance for the location of the specimen as a function of wavelength.

6 . The OCT system of claim 1 , wherein the interferometer is further configured to:

split incident illumination into a test beam for illuminating the specimen and a reference beam;

receive, a reflection of the test beam from the location of the specimen, as the reflected test beam; and

receive, a reflection of the reference beam from a reference mirror, as the reflected reference beam.

7 . The OCT system of claim 6 , further comprising an illumination source configured to produce the incident illumination, the illumination source including one or a combination of a laser, a superluminescent diode (SLD), or a light-emitting diode (LED).

8 . The OCT system of claim 1 , wherein the spectrum comprises a signal intensity peak corresponding to each layer of the different layers of the specimen, and wherein to determine the profilometry measurements, the processor is configured to identify at least one candidate intensity peak in the spectrum as at least one signal intensity peak of the signal intensity peaks corresponding to the different layers of the specimen, based on the at least one candidate intensity peak having an intensity value above the threshold.

9 . The OCT system of claim 8 , wherein the processor is further configured to assign a location of the at least one candidate intensity peak having the intensity value above the threshold, as a depth of at least one corresponding layer of the different layers of the specimen.

10 . The OCT system of claim 1 , wherein the spectrometer comprises:

a diffraction grating configured to diffract different beams of different wavelengths forming the interference pattern into different diffraction angles; and

a detector array with detecting elements arranged at the different diffraction angles to measure intensities of different beams corresponding to the interference pattern.

11 . The OCT system of claim 10 , wherein the detecting elements of the detector array are calibrated to map each index of the detecting elements in the detector array with a corresponding wavelength.

12 . The OCT system of claim 1 , wherein the interferometer is a Michelson interferometer or a Linnik interferometer.

13 . A method for profilometry measurements of a specimen in an optical coherence tomography (OCT) system, the method comprising:

interfering a reflected test beam, reflected from the specimen, with a reflected reference beam, reflected from a reference mirror, to produce an interference pattern;

measuring a spectrum of the interference pattern to produce measurements of intensities of the interference pattern corresponding to different wavelengths;

determining noise statistics of the intensities of the interference pattern;

using the noise statistics to set a threshold for detecting a number of layers of the specimen penetrated by the test beam at a location of the specimen based on a pre-specified probability of false acceptance of noise as a signal; and

determining the profilometry measurements as an estimate of depths of the layers of the specimen causing the intensities of the interference pattern above the threshold.

14 . The method of claim 13 , wherein determining the noise statistics comprises:

obtaining a smooth estimate of the spectrum of the interference pattern defining mean values of the noise statistics for the different wavelengths;

grouping the wavelengths based on similarities of their mean values to produce groups of wavelengths;

computing a group variance estimate within each of the groups of wavelengths; and

assigning the group variance estimate to each wavelength in a group of wavelengths of the groups of wavelengths.

15 . The method of claim 14 , wherein the smooth estimate of the spectrum of the interference pattern is obtained from a spectrum of the reference beam.

16 . The method of claim 13 , further comprising producing the estimate of the depths of the layers of the specimen using a greedy optimization.

17 . The method of claim 13 , further comprising:

splitting incident illumination into a test beam for illuminating the specimen and a reference beam;

receiving, a reflection of the test beam from the location of the specimen, as the reflected test beam; and

receiving, a reflection of the reference beam from a reference mirror, as the reflected reference beam.

18 . The method of claim 13 , wherein the spectrum comprises a signal intensity peak corresponding to each layer of the different layers of the specimen, and wherein for determining the profilometry measurements, the method further comprises identifying at least one candidate intensity peak in the spectrum as at least one signal intensity peak of the signal intensity peaks corresponding to the layers of the specimen, based on the at least one candidate intensity peak having an intensity value above the threshold.

19 . The method of claim 18 , further comprising assigning a location of the at least one candidate intensity peak having the intensity value above the threshold, as a depth of at least one corresponding layer of the layers of the specimen.

20 . A non-transitory computer readable medium having stored thereon computer-executable instructions which when executed by a computer, causes the computer to perform a method for profilometry measurements of a specimen in an optical coherence tomography (OCT) system, the method comprising:

interfering a reflected test beam, reflected from the specimen, with a reflected reference beam, reflected from a reference mirror, to produce an interference pattern;

measuring a spectrum of the interference pattern to produce measurements of intensities of the interference pattern corresponding to different wavelengths;

determining noise statistics of the intensities of the interference pattern;

using the noise statistics to set a threshold for detecting a number of layers of the specimen penetrated by the test beam at a location of the specimen based on a pre-specified probability of false acceptance of noise as a signal; and

determining the profilometry measurements as an estimate of depths of the layers of the specimen causing the intensities of the interference pattern above the threshold.