IP Library Granted Patent US 12663297
Granted Patent B2
US 12663297 · App. 18/644,569 · Granted Jun 23, 2026

Optical sensing assembly and encoder

Inventors: Horng-Jou Wang (Taoyuan City, TW); Jeng-Ping Lin (Taoyuan City, TW); Ching-Cheng Wang (Taoyuan City, TW); Chieh-Huang Lu (Taoyuan City, TW); Chun-Hao Huang (Taoyuan City, TW)
Assignee: DELTA ELECTRONICS, INC.
G01D5/34715G01D5/34794G01D5/3473G01D5/34746
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Quick Facts
Patent No.
US 12663297
App. No.
18/644,569
Granted
Jun 23, 2026
Kind
B2
Abstract

An optical sensing assembly includes a scale, a sensor, and a light source. The scale includes a first pattern area and a second pattern area. The first pattern area includes first patterns periodically arranged in the first direction. The second pattern area includes second patterns periodically arranged in the first direction and a second direction. The sensor is configured to move relative to the scale in the first direction and includes a first sensing area, a second sensing area, and a third sensing area. The first sensing area is configured to sense a change of the first pattern area in the first direction. The second sensing area and the third sensing area are configured to sense changes of the second pattern area respectively in the first direction and the second direction. The light source is configured to emit light toward the scale.

Claims (39)

1 . An optical sensing assembly, comprising:

a scale comprising:

a first pattern area comprising a plurality of first patterns periodically arranged in a first direction; and

a second pattern area comprising a plurality of second patterns periodically arranged in the first direction and a second direction;

a sensor configured to move relative to the scale in the first direction and comprising:

a first sensing area configured to sense a change of the first pattern area in the first direction;

a second sensing area configured to sense a change of the second pattern area in the first direction; and

a third sensing area configured to sense a change of the second pattern area in the second direction; and

a light source configured to emit light toward the scale,

wherein the second patterns arranged along the first direction are gradually shifted in the second direction, the second patterns are arranged in a plurality of columns, the columns have a pitch in the first direction, the second patterns in each of the columns have another pitch in the second direction, and after passing a distance of N times the pitch along the first direction, the columns are gradually shifted in the second direction by a distance of the another pitch, wherein N is an integer greater than 2.

2 . The optical sensing assembly of claim 1 , wherein when the sensor moves a distance of N times the pitch in the first direction relative to the scale, the second sensing area generates N periodic signals and the third sensing area generates one periodic signal.

3 . The optical sensing assembly of claim 1 , wherein sensing units of each of the first sensing area, the second sensing area, and the third sensing area are arranged into a phased-array.

4 . An encoder, comprising:

an optical sensing assembly comprising:

a scale comprising:

a first pattern area comprising a plurality of first patterns periodically arranged in a first direction; and

a second pattern area comprising a plurality of second patterns periodically arranged in the first direction and a second direction;

a sensor configured to move relative to the scale in the first direction and comprising:

a first sensing area configured to sense a change of the first pattern area in the first direction and accordingly generate a first sensing position signal;

a second sensing area configured to sense a change of the second pattern area in the first direction and accordingly generate a second sensing position signal; and

a third sensing area configured to sense a change of the second pattern area in the second direction and accordingly generate a third sensing position signal; and

a signal processing unit connected to the sensor and configured to:

calculate a first sensing position information, a second sensing position information, and a third sensing position information respectively from the first sensing position signal, the second sensing position signal, and the third sensing position signal;

generate a first synthesized position information according to the first sensing position information and the second sensing position information; and

generate a second synthesized position information according to the third sensing position information and the first synthesized position information.

5 . The encoder of claim 4 , wherein the second patterns arranged along the first direction are gradually shifted in the second direction.

6 . The encoder of claim 5 , wherein the second patterns are arranged in a plurality of columns, the columns have a pitch in the first direction, the second patterns in each of the columns have another pitch in the second direction, and after passing a distance of N times the pitch along the first direction, the columns are gradually shifted in the second direction by a distance of the another pitch, wherein N is an integer greater than 2.

7 . The encoder of claim 6 , wherein when the sensor moves a distance of N times the pitch in the first direction relative to the scale, the second sensing area generates N periodic signals and the third sensing area generates one periodic signal.

8 . The encoder of claim 4 , wherein sensing units of each of the first sensing area, the second sensing area, and the third sensing area are arranged into a phased-array.

9 . The encoder of claim 4 , wherein the signal processing unit is configured to use the first sensing position information and the second sensing position information to calculate the first synthesized position information based on Vernier effect.

10 . The encoder of claim 9 , wherein the first sensing position information has a first pitch, the second sensing position information has a second pitch, the first synthesized position information has a first synthesized pitch, wherein the second pitch is (N-2)/(N-1) times the first pitch, such that the first synthesized pitch is (N-2) times the first pitch or (N-1) times the second pitch, wherein N is an integer greater than 2.

11 . The encoder of claim 9 , where the first sensing position information has N2 signal cycles within a 360-degree mechanical angle, and the second sensing position information has N(N-1) signal cycles within a 360-degree mechanical angle, such that the first synthesized position information has N signal cycles within a 360-degree mechanical angle, wherein N is an integer greater than 2.

12 . The encoder of claim 4 , wherein the signal processing unit is configured to use the third sensing position information and the first synthesized position information to calculate the second synthesized position information based on Vernier effect.

13 . The encoder of claim 12 , wherein the third sensing position information has a third pitch, the first synthesized position information has a first synthesized pitch, the second synthesized position information has a second synthesized pitch, wherein the first synthesized pitch is (N-1)/N times the third pitch, such that the second synthesized pitch is (N-1) times the third pitch or N times the first synthesized pitch, wherein N is an integer greater than 2.

14 . The encoder of claim 12 , wherein the third sensing position information has (N-1) signal cycles within a 360-degree mechanical angle, and the first synthesized position information has N signal cycles within a 360-degree mechanical angle, such that the second synthesized position information has one signal cycle within a 360-degree mechanical angle, wherein N is an integer greater than 2.

15 . The encoder of claim 4 , wherein the signal processing unit is further configured to:

analyze a first position from the second synthesized position information;

map the first position to the first synthesized position information or the third sensing position information to analyze a second position; and

map the second position to the first sensing position information or the second sensing position information to analyze a third position.