Imaging device and method for holographic imaging of samples

Inventors: Ziduo Lin (Heverlee, BE); Richard Stahl (Rotselaar, BE); Geert Vanmeerbeeck (Keerbergen, BE); Abdulkadir Yurt (Leuven, BE)

Assignee: IMEC VZW

G02B27/10 G01N15/0205 G02B27/0916 G03H1/0465 G02B2207/101 G03H2210/30 G03H2222/42 G03H2222/43

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Quick Facts

Patent No.: US 12663656
App. No.: 18/071,750
Granted: Jun 23, 2026
Kind: B2

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Abstract

Embodiments of the present disclosure provide an imaging device for holographic imaging of a sample, the imaging device comprising a light source generating a light beam, a beam splitter splitting the light beam into an object beam along an object beam path and a reference beam along a reference beam path, and a detector. The imaging device defines a sample position. The object beam is propagated through the sample position, and the detector is arranged to prevent non-scattered object light, passing through the sample position without being scattered by the sample, from being incident onto the detector. The reference beam is propagated through the sample position, and the detector is arranged so that non-scattered reference light, passing through the sample position without being scattered by the sample, is incident onto the detector. The detector detects an interference pattern formed by scattered object light and the non-scattered reference light.

Claims (34)

1 . An imaging device for holographic imaging of a sample, the imaging device comprising:

a light source configured to generate a light beam;

a beam splitter configured to receive the light beam and to split the light beam into an object beam along an object beam path in the imaging device and a reference beam along a reference beam path in the imaging device; and

a detector comprising an array of light sensitive areas,

wherein the imaging device defines a sample position, the sample position being configured for receiving the sample,

wherein the object beam path is arranged in the imaging device such that the object beam is propagated through the sample position, and wherein the detector is arranged in relation to the object beam path so as to prevent non-scattered object light, passing through the sample position without being scattered by the sample, from being incident onto the array of light sensitive areas,

wherein the reference beam path is arranged in the imaging device such that the reference beam is propagated through the sample position, and wherein the detector is arranged in relation to the reference beam path so that non-scattered reference light, passing through the sample position without being scattered by the sample, is incident onto the array of light sensitive areas,

wherein the detector is configured to detect an interference pattern formed by interference between scattered object light, being scattered by the sample, and the non-scattered reference light,

wherein the detector is arranged with respect to the object beam such that a portion of the object beam path passing through the sample position extends in a direction parallel with a plane of the detector onto which the array of light sensitive areas is arranged.

2 . The imaging device according to claim 1 , wherein the beam splitter is further configured to split the light beam such that a light intensity of the object beam is higher than a light intensity of the reference beam.

3 . The imaging device according to claim 2 , wherein the beam splitter is further configured to split the light beam such that the ratio of the light intensity of the object beam to the light intensity of the reference beam is greater than 1.

4 . The imaging device according to claim 2 , wherein the beam splitter is further configured to split the light beam such that the ratio of the light intensity of the object beam to the light intensity of the reference beam is greater than 3.

5 . The imaging device according to claim 2 , wherein the beam splitter is further configured to split the light beam such that the ratio of the light intensity of the object beam to the light intensity of the reference beam is greater than 10.

6 . The imaging device according to claim 2 , wherein the beam splitter is further configured to split the light beam such that the ratio of the light intensity of the object beam to the light intensity of the reference beam is greater than 19.

7 . The imaging device according to claim 1 , further configured such that a cross-section of the object beam, upon being propagated through the sample position, is confined in at least one direction.

8 . The imaging device according to claim 7 , further configured such that the object beam, upon being propagated through the sample position, is in a shape of a light sheet.

9 . The imaging device according to claim 8 , further comprising sheet optics arranged in the object beam path, the sheet optics being configured to shape the object beam to a light sheet prior to the object beam being propagated through the sample position.

10 . The imaging device according to claim 1 , wherein the light source is configured to generate light being at least partly coherent.

11 . The imaging device according to claim 1 , wherein the light source is a laser.

12 . The imaging device according to claim 1 , further comprising a receptacle configured to receive a sample holder in which the sample may be placed, and to hold the sample holder such that the sample in the sample holder is located in the sample position.

13 . The imaging device according to claim 1 , further comprising a flow channel configured for receiving a flow of a fluid in which the sample is contained, the flow channel being arranged such that the flow through the flow channel is passed through the sample position.

14 . A method for holographic imaging of a sample located in a sample position, the method comprising:

generating, by a light source, a light beam;

receiving, at a beam splitter, the light beam;

splitting, by the beam splitter, the light beam into an object beam along an object beam path and a reference beam along a reference beam path;

propagating the object beam through the sample position so as to prevent non-scattered object light, passing through the sample position without being scattered by the sample, from being incident onto an array of light sensitive areas;

propagating the reference beam through the sample position so that non-scattered reference light, passing through the sample position without being scattered by the sample, is incident onto the array of light sensitive areas; and

detecting, by a detector comprising the array of light sensitive areas, an interference pattern formed by interference between scattered object light, being scattered by the sample, and the non-scattered reference light,

15 . The method according to claim 14 , further comprising:

splitting, by the beam splitter, the light beam such that a light intensity of the object beam is higher than a light intensity of the reference beam.

16 . The method according to claim 14 , further comprising:

shaping the object beam to a light sheet prior to propagating the object beam through the sample position.

17 . The method according to claim 14 , wherein the method is used for imaging an object in the sample that is smaller than a wavelength of the light.