IP Library Granted Patent US 12665132
Granted Patent B2
US 12665132 · App. 18/770,775 · Granted Jun 23, 2026

Multilayer ceramic capacitor and method of manufacturing the same

Inventors: Hyoju Lee (Suwon-si, KR); Sanghyun Lee (Suwon-si, KR); Tae Hyung Kim (Suwon-si, KR); Nam Woon Kim (Suwon-si, KR)
Assignee: SAMSUNG ELECTRO-MECHANICS CO., LTD.
H01G4/1227C04B35/4682C04B35/62821C04B35/64C04B37/001C04B41/0072C04B41/4578C04B41/5144C04B41/88H01G4/30C04B2235/3224C04B2235/3236C04B2235/3239C04B2235/3244C04B2235/3262C04B2235/781C04B2235/785C04B2235/85C04B2237/346C04B2237/68
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Quick Facts
Patent No.
US 12665132
App. No.
18/770,775
Granted
Jun 23, 2026
Kind
B2
Abstract

Provided are a multilayer ceramic capacitor and a method of manufacturing the same, the multilayer ceramic capacitor including a capacitor body including a dielectric layer and an internal electrode layer, and an external electrode disposed on an outer surface the capacitor body, wherein the dielectric layer includes a plurality of dielectric grains, at least one of the plurality of dielectric grains includes a dielectric composite in which a barium titanate-based compound is doped with hafnium (Hf) or a first transition metal; and a subcomponent including a rare earth element, a second transition metal, or a combination thereof.

Claims (71)

1 . A multilayer ceramic capacitor, comprising

a capacitor body including a dielectric layer and an internal electrode layer, and

an external electrode disposed on an outer surface of the capacitor body,

wherein the dielectric layer includes a plurality of dielectric grains,

at least one of the plurality of dielectric grains includes: a dielectric composite in which a barium titanate-based compound is doped with hafnium (Hf) or a first transition metal; and a subcomponent including a rare earth element, a second transition metal, or a combination thereof,

according to a TEM-EDS (transmission electron microscopy-energy dispersive spectroscopy) line analysis of the at least one of the plurality of dielectric grains from a center to a grain boundary of the at least one of the plurality of dielectric grains, a first point having a maximum atom percent (at %) of hafnium (Hf) or the first transition metal with respect to a total number of atoms of the at least one of the plurality of dielectric grains is different from a location of a second point having a maximum atom percent (at %) of the rare earth element or the second transition metal with respect to the total number of atoms of the at least one of the plurality of dielectric grains, and

the first transition metal excludes hafnium (Hf), and the first transition metal and the second transition metal are different from each other.

2 . The multilayer ceramic capacitor of claim 1 , wherein

according to the TEM-EDS (transmission electron microscopy-energy dispersive spectroscopy) line analysis of the at least one of the plurality of dielectric grains,

the second point is located further outside from the center of the at least one of the plurality of dielectric grain than the first point.

3 . The multilayer ceramic capacitor of claim 1 , wherein

the at least one of the plurality of dielectric grains has a core-double shell structure including a core; a first shell surrounding at least a portion of the core; and a second shell surrounding at least a portion of the first shell.

4 . The multilayer ceramic capacitor of claim 3 , wherein

the first shell includes the dielectric composite, and

the second shell includes the subcomponent.

5 . The multilayer ceramic capacitor of claim 4 , wherein

according to the TEM-EDS (transmission electron microscopy-energy dispersive spectroscopy) line analysis,

the first shell is a region including a peak with the maximum atom percent of hafnium (Hf) or the first transition metal,

the second shell is a region including a peak with the maximum atom percent of the rare earth element or the second transition metal, and

the regions of the first shell and the second shell are different from each other.

6 . The multilayer ceramic capacitor of claim 5 , wherein

the first shell includes a higher atom percent of hafnium (Hf) or the first transition metal than an atom percent of the rare earth element or the second transition metal, and

the second shell includes a smaller atom percent of hafnium (Hf) or the first transition metal than an atom percent of the rare earth element or the second transition metal.

7 . The multilayer ceramic capacitor of claim 1 , wherein

the first transition metal includes at least one selected from the group consisting of zirconium (Zr), yttrium (Y), tantalum (Ta), niobium (Nb), and combinations thereof.

8 . The multilayer ceramic capacitor of claim 1 , wherein

the rare earth element includes at least one selected from the group consisting of dysprosium (Dy), terbium (Tb), yttrium (Y), lanthanum (La), cerium (Ce), samarium (Sm), gadolinium (Gd), holmium (Ho), erbium (Er), and combinations thereof.

9 . The multilayer ceramic capacitor of claim 1 , wherein

the second transition metal includes manganese (Mn), vanadium (V), or a combination thereof.

10 . The multilayer ceramic capacitor of claim 1 , wherein

hafnium (Hf) or the first transition metal is doped in an amount of 0.1 atomic % to 5 atomic % based on a total amount of the dielectric composite.

11 . The multilayer ceramic capacitor of claim 4 , wherein

the subcomponent is included in an amount of 0.1 atomic % to 2 atomic % based on a total amount of components of the second shell.

12 . The multilayer ceramic capacitor of claim 3 , wherein

a length of the core, which is measured from a major axis passing through the center of the at least one of the plurality of dielectric grains, is 50 nm to 150 nm.

13 . The multilayer ceramic capacitor of claim 3 , wherein

an average length of the first shell, which is measured from a major axis passing through the center of the at least one of the plurality of dielectric grains, is 10 nm to 50 nm.

14 . The multilayer ceramic capacitor of claim 3 , wherein

an average length of the second shell, which is measured from a major axis passing through the center of the at least one of the plurality of dielectric grains, is 40 nm to 240 nm.

15 . The multilayer ceramic capacitor of claim 1 , wherein

the plurality of dielectric grains have an average diameter of greater than or equal to 100 nm and less than 266 nm.

16 . The multilayer ceramic capacitor of claim 3 , wherein

a number ratio of the dielectric grains having the core-double shell structure among the plurality of dielectric grains is greater than or equal to 50% and less than or equal to 100%.

17 . A method of manufacturing a multilayer ceramic capacitor, comprising

preparing a dielectric composite powder in which a barium titanate-based compound is doped with hafnium (Hf) or a first transition metal (TM);

manufacturing a dielectric green sheet using a dielectric slurry including the dielectric composite powder and subcomponent powder, and forming a conductive paste layer on a surface of the dielectric green sheet;

manufacturing a dielectric green sheet stack by stacking the dielectric green sheets on which the conductive paste layer is formed;

manufacturing a capacitor body including a dielectric layer and an internal electrode layer by firing the dielectric green sheet stack; and

forming an external electrode on one surface of the capacitor body,

wherein the dielectric layer includes a plurality of dielectric grains,

at least one of the plurality of dielectric grains includes a dielectric composite in which a barium titanate-based compound is doped with hafnium (Hf) or a first transition metal; and a subcomponent including a rare earth element, a second transition metal, or a combination thereof,

according to the TEM-EDS (transmission electron microscopy-energy dispersive spectroscopy) line analysis of the at least one of the plurality of dielectric grains from a center to a grain boundary of the at least one of the plurality of dielectric grains, a first point having a maximum atom percent (at %) of hafnium (Hf) or the first transition metal with respect to a total number of atoms of the at least one of the plurality of dielectric grains is different from a location of a second point having a maximum atom percent (at %) of the rare earth element or the second transition metal with respect to a total number of atoms of the at least one of the plurality of dielectric grains, and

the first transition metal excludes hafnium (Hf), and the first transition metal and the second transition metal are different from each other.

18 . The method of claim 17 , wherein

the dielectric composite powder includes

a core portion including the barium titanate-based compound, and

a shell portion surrounding at least a portion of the core portion and including Ba(Ti, Hf)O 3 or Ba(Ti, TM)O 3 .

19 . The method of claim 18 , wherein

the dielectric composite powder is prepared by

preparing a barium titanate seed including barium (Ba) and titanium (Ti) by hydrothermal synthesis; and

mixing the barium titanate seed with a hafnium (Hf)-containing compound or a first transition metal-containing compound.

20 . The method of claim 19 , wherein

the hafnium (Hf)-containing compound or the first transition metal-containing compound is mixed in an amount of 0.1 parts by mole to 3 parts by mole based on 100 parts by mole of titanium (Ti).

21 . The method of claim 19 , wherein

the first transition metal-containing compound includes at least one selected from the group consisting of a zirconium (Zr)-containing compound, a yttrium (Y)-containing compound, a tantalum (Ta)-containing compound, a niobium (Nb)-containing compound, and combinations thereof.

22 . The method of claim 17 , wherein

the subcomponent powder includes a rare earth element-containing compound, a second transition metal-containing compound, or a combination thereof.

23 . The method of claim 22 , wherein

the rare earth element-containing compound includes at least one selected from the group consisting of a dysprosium (Dy)-containing compound, a terbium (Tb)-containing compound, a yttrium (Y)-containing compound, a lanthanum (La)-containing compound, a cerium (Ce)-containing compound, a samarium (Sm)-containing compound, a gadolinium (Gd)-containing compound, a holmium (Ho)-containing compound, an erbium (Er)-containing compound, and combinations thereof.

24 . The method of claim 22 , wherein

the second transition metal-containing compound includes at least one selected from the group consisting of a manganese (Mn)-containing compound, a vanadium (V)-containing compound, and combinations thereof.