IP Library Granted Patent US 12665174
Granted Patent B2
US 12665174 · App. 18/895,491 · Granted Jun 23, 2026

Wafer placement table

Inventors: Seiya Inoue (Handa-City, JP); Tatsuya Kuno (Nagoya-City, JP)
Assignee: NGK INSULATORS, LTD.
H01J37/32724H01J37/32807
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Quick Facts
Patent No.
US 12665174
App. No.
18/895,491
Granted
Jun 23, 2026
Kind
B2
Abstract

A wafer placement table includes a ceramic substrate having a wafer placement surface on an upper surface thereof and containing an electrode therein; a conductive substrate disposed adjacent to a lower surface of the ceramic substrate, serving also as a plasma generating electrode, and having the same diameter as the ceramic substrate; a support substrate disposed adjacent to a lower surface of the conductive substrate, having a greater diameter than the conductive substrate, and electrically insulated from the conductive substrate; and a mounting flange constituting a part of the support substrate and radially extending out of the conductive substrate.

Claims (13)

1 . A wafer placement table comprising:

a ceramic substrate having a wafer placement surface on an upper surface thereof, the ceramic substrate containing an electrode therein;

a conductive substrate disposed adjacent to a lower surface of the ceramic substrate, having a cooling medium passage or a cooling medium passage groove, serving also as a plasma generating electrode;

a support substrate disposed adjacent to a lower surface of the conductive substrate, having a greater diameter than the conductive substrate, and electrically insulated from the conductive substrate; and

a mounting flange constituting a part of the support substrate and radially extending out of the conductive substrate.

2 . The wafer placement table according to claim 1 , wherein the conductive substrate is made of metal matrix composite.

3 . The wafer placement table according to claim 1 , wherein the conductive substrate is made of SiSiCTi.

4 . The wafer placement table according to claim 1 , wherein the conductive substrate is made of AlSiC.

5 . The wafer placement table according to claim 1 , wherein the support substrate is formed of an insulating material.

6 . The wafer placement table according to claim 5 , wherein a first joining layer configured to join the ceramic substrate to the conductive substrate and a second joining layer configured to join the conductive substrate to the support substrate are both metal joining layers.

7 . The wafer placement table according to claim 5 , wherein the conductive substrate has the cooling medium passage groove, and the cooling medium passage groove has an opening in the surface of the conductive substrate facing the support substrate.

8 . The wafer placement table according to claim 1 , wherein the support substrate is formed of metal, and the support substrate and the conductive substrate are provided with an insulating layer therebetween.

9 . The wafer placement table according to claim 8 , wherein the support substrate has screw holes in a lower surface thereof.