IP Library Granted Patent US 12665177
Granted Patent B2
US 12665177 · App. 17/798,061 · Granted Jun 23, 2026

Vibration damping and resonance reduction for ion pump

Inventors: Chenxi Fu (San Jose, CA); Long Di (San Jose, CA); Lucas Kuindersma (Eindhoven, NL); Kuo-Feng Tseng (San Jose, CA); Peter Paul Hempenius (San Jose, CA); Yu Liu (San Jose, CA); Ying Luo (San Jose, CA)
Assignee: ASML Netherlands B.V.
H01J41/12F04B37/02H01J37/28
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12665177
App. No.
17/798,061
Granted
Jun 23, 2026
Kind
B2
Abstract

Apparatuses and systems for damping vibration of a vacuum vessel mounted with a pump include a pump body and a damping element coupled to the pump body, wherein the pump body and the damping element form a mass-based damper, and wherein the pump body forms a mass component of the mass-based damper; and the damping element forms a damping component of the mass-based damper. The apparatuses and systems also include a pump body configured to be secured to a column of a charged-particle inspection apparatus, a sensor coupled to the pump body, an actuator coupled to the pump body, and a circuitry communicatively coupled to the sensor and the actuator for receiving motion data indicative of a vibration of the column; determining a damping based on the motion data; and actuate the actuator to react to the vibration of the column in accordance with the damping.

Claims (24)

1 . An ion pump, comprising:

a pump body comprising a wall, the wall comprising a first opening; and

an inlet pipe connected to the first opening, comprising:

a pipe portion having a first end portion secured to the first opening, and

a flange portion having a second opening, wherein the flange portion is secured to a second end portion of the pipe portion such that stiffness of connection of the flange portion and the second end portion is greater than or equal to 10 7 Newton Per Meter.

2 . The ion pump of claim 1 , wherein an outer surface of the first end portion is inside the first opening, and the first end portion is secured to the first opening on a first side of the wall inside the pump body and on an outer surface of the first end portion outside the pump body.

3 . The ion pump of claim 1 , wherein the first end portion is secured to the first opening on a first side of the wall inside the pump body and on an outer surface of the first end portion outside the pump body.

4 . The ion pump of claim 1 , further comprising:

a housing configured to hold the pump body; and

a T-shape connector configured to secure the pump body to the housing.

5 . The ion pump of claim 4 , wherein the housing comprises a pole piece of a magnet set.

6 . The ion pump of claim 4 , wherein the T-shape connector is further configured to bolt the pump body to the housing.

7 . The ion pump of claim 4 , further comprising a plurality of T-shape connectors configured to secure the pump body to the housing.

8 . The ion pump of claim 4 , wherein thickness of the T-shape connector is greater than or equal to 3 millimeters.

9 . The ion pump of claim 4 , wherein thickness of the T-shape connector is greater than or equal to 9 millimeters.

10 . The ion pump of claim 3 , wherein the first end portion is welded to the first opening on the first side of the wall inside the pump body and on the outer surface of the first end portion outside the pump body.

11 . The ion pump of claim 1 , further comprising:

a feature configured to reinforce connection of the first end portion and the first opening, wherein the feature connects an outer surface of the first end portion to a second side of the wall outside the pump body such that stiffness of the connection of the first end portion and the first opening is greater than or equal to 10 7 Newton Per Meter.

12 . The ion pump of claim 1 , wherein the second opening is further configured to be connected to a vessel, wherein the ion pump is configured to generate a vacuum in the vessel.

13 . The ion pump of claim 1 , wherein the inlet pipe and the wall are manufactured as an inseparable part.

14 . The ion pump of claim 11 , wherein a natural frequency of the ion pump is greater than or equal to 150 Hz when the stiffness of connection of the flange portion and the second end portion is greater than or equal to 10 7 Newton Per Meter and the stiffness of the connection of the first end portion and the first opening is greater than or equal to 10 7 Newton Per Meter.

15 . A charged-particle inspection system, comprising:

a charged-particle inspection apparatus; and

an ion pump of claim 1 , connected to a vessel of the charged-particle inspection apparatus for generating a vacuum in the vessel.