IP Library Granted Patent US 12666882
Granted Patent B2
US 12666882 · App. 18/147,076 · Granted Jun 23, 2026

3-dimensional memristor element and method for manufacturing the same

Inventors: Seokwoo Jeon (Daejeon, KR); Gwangmin Bae (Daejeon, KR); Gunho Chang (Daejeon, KR)
Assignee: Korea Adanced Institute of Science and Technology
H10N70/881H10N70/023H10N70/24H10N70/841
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Quick Facts
Patent No.
US 12666882
App. No.
18/147,076
Granted
Jun 23, 2026
Kind
B2
Abstract

A 3D memristor element includes a 3D nano-composite including a resistance-varying part, a first conductor and a second conductor, a first terminal electrically connected to the first conductor, and a second terminal electrically connected to the second conductor. The resistance-varying part includes a plurality of nano-shells, which are three-dimensionally arranged and connected to each other. The first conductor is disposed in the nano-shells and has a 3D network structure thereby forming a 3D interface with the nano-shells. The second conductor three-dimensionally surrounds the resistance-varying part, and is separated from the first conductor by the resistance-varying part.

Claims (17)

1 . A 3-dimensional (3D) memristor element comprising:

a 3D nano-composite including a resistance-varying part including a plurality of nano-shells, which are three-dimensionally arranged and connected to each other, a first conductor disposed in the nano-shells and having a 3D network structure thereby forming a 3D interface with the nano-shells, and a second conductor three-dimensionally surrounding the resistance-varying part and being separated from the first conductor by the resistance-varying part;

a first terminal electrically connected to the first conductor; and

a second terminal electrically connected to the second conductor.

2 . The 3D memristor element of claim 1 , wherein the resistance-varying part includes at least one of a metal, a metal oxide, a metal nitride and a polymer.

3 . The 3D memristor element of claim 2 , wherein the resistance-varying part includes at least one of InO 2 , SnO 2 , SrTiO 3 , SiO x , CeO 2 , Al 2 O 3 , TiO 2 , ZnO, HfO 2 , HfAlO x , HfSiO x , TaO x , PCMO(Pr 0.3 Ca 0.7 MnO 3 ), SiN x , TiN x , TaN x , amorphous silicon, Ag and pV3D3 (poly(1,3,5-trimethyl-1,3,5-trivinyl cyclotrisiloxane).

4 . The 3D memristor element of claim 1 , further comprising a dummy layer including a same material as the resistance-varying part and disposed on the first terminal,

wherein the second terminal is disposed on the dummy layer, and the first terminal is disposed under the 3D nano-composite.

5 . The 3D memristor element of claim 4 , wherein the second terminal includes a same material as the second conductor.

6 . The 3D memristor element of claim 1 , wherein a shell thickness of the resistance-varying part is 1 nm to 100 nm.

7 . The 3D memristor element of claim 1 , wherein the resistance-varying part includes:

a resistance-varying layer contacting the first conductor; and

an oxygen-storing layer contacting the second conductor and including a material different from the resistance-varying layer to have a composition including an oxygen vacancy.

8 . The 3D memristor element of claim 7 , wherein the resistance-varying layer includes a ferroelectric material, and the oxygen-storing layer includes at least one of BiFeO 3 , HfO x , TiO 2-x , Sb 2 Te 3 and TaO 2-x .

9 . The 3D memristor element of claim 1 , wherein the first conductor includes:

a filling portion including a metal and spaced apart from the resistance-varying part; and

a contact layer including a metal oxide or a metal nitride and contacting the resistance-varying part.