Method of depositing condensable material onto a surface of a substrate
Methods of depositing material onto a surface of a substrate. Exemplary methods include flowing a gas-phase precursor within the reaction chamber, condensing the precursor onto the surface of the substrate to form condensed material, and curing the condensed material to transform the condensed material to cured material. The step of curing can be a plasma process and can include use of a reactant.
1 . A method of depositing material onto a surface of a substrate, the method comprising:
providing the substrate onto a susceptor within a reaction chamber of a reactor, the substrate surface comprising a gap;
flowing a gas-phase precursor within the reaction chamber, the gas-phase precursor heated to a temperature T1 prior to entering the gas-phase reactor;
condensing the precursor onto the surface of the substrate to form condensed material; and
curing the condensed material to transform the condensed material to cured material,
wherein a temperature T2 of the susceptor during the step of condensing is less than T1, and
wherein the cured material consists essentially of one or more of conductive material or semiconductive material.
2 . The method of claim 1 , wherein the condensed material is a liquid.
3 . The method of claim 1 , wherein the condensed material flows within the gap prior to the step of curing.
4 . The method of claim 1 , wherein the precursor comprises one or more of silicon and a metal.
5 . The method claim 1 , wherein the precursor comprises one or more of a metal halide, an alkylamino compound, and a methyl compound.
6 . The method of claim 1 , wherein the precursor is selected from the group consisting of tetrakis-dimethylaminotitanium (TDMAT), titanium tetrachloride, Silacore, bis-diethylaminosilane (BDEAS), tetrakis(dimethylamido)zirconium (TDMAZr), tris(dimethylamino)cyclopentadienyl-zirconium, tetrakis(dimethylamido)hafnium (TDMAHf), and tris(dimethylamino)cyclopentadienyl-hafnium.
7 . The method of claim 1 , wherein a pressure within the reaction chamber during the step of condensing the precursor onto the surface of the substrate is between about 400 Pa and about 1000 Pa.
8 . The method of claim 1 , wherein T2 is less than 50° C.
9 . The method of claim 1 , wherein T1 is greater than 50° C.
10 . The method of claim 1 , wherein the step of curing comprises forming a plasma.
11 . The method of claim 10 , wherein the step of forming a plasma comprises forming a direct plasma.
12 . The method of claim 10 , wherein the step of forming a plasma comprises providing a plasma power of greater than 200 W.
13 . The method of any of claim 1 , further comprising flowing a reactant into the reaction chamber.
14 . The method of claim 13 , wherein the reactant is selected from one or more reactants selected from the group consisting of nitrogen (N 2 ), hydrogen (H 2 ), hydrazine, a hydrazine derivative, and any combination thereof.
15 . The method of claim 13 , wherein the reactant is continuously flowed during one or more steps of condensing the precursor onto the surface of the substrate and curing the condensed material to transform the condensed material to cured material.
16 . The method of claim 1 , further comprising a step of maintaining a temperature of a wall of the reaction chamber at a temperature T3, wherein T3 is greater than T2.
17 . The method of claim 1 , wherein the cured material comprises less than 30 at % carbon.
18 . The method of claim 1 , wherein the gas-phase precursor comprises carbon.
19 . A structure comprising deposited material formed according to the method of claim 1 .
20 . A reactor system to perform a method according to claim 1 .