IP Library Granted Patent US 12666976
Granted Patent B2
US 12666976 · App. 18/519,176 · Granted Jun 23, 2026

Semiconductor device

Inventors: Katsuya Sato (Yokohama, JP); Tetsuya Yamamoto (Sagamihara, JP)
Assignees: KABUSHIKI KAISHA TOSHIBA; TOSHIBA ELECTRONIC DEVICES & STORAGE CORPORATION
H10W70/481H10W70/415H10W70/417H10W70/464H10W90/736
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Quick Facts
Patent No.
US 12666976
App. No.
18/519,176
Granted
Jun 23, 2026
Kind
B2
Abstract

According to an embodiment, a semiconductor device includes a first electrode, a second electrode, a semiconductor chip, and a third electrode. The second electrode includes a plurality of terminals, and one slit. The one slit is formed between adjacent two out of the plurality of terminals. The semiconductor chip includes a first face and a second face. The first face is connected to the first electrode via a joining material. The second face is opposite the first face and connected to the second electrode via a joining material. The third electrode is connected to the second face via a joining material, inside the slit provided in the second electrode.

Claims (22)

1 . A semiconductor device comprising:

a first electrode;

a second electrode including a plurality of terminals, and one slit formed between adjacent two out of the plurality of terminals;

a semiconductor chip including a first face connected to the first electrode via a joining material, and a second face being opposite the first face and connected to the second electrode via a joining material; and

a third electrode connected to the second face via a joining material, inside the slit provided in the second electrode.

2 . The semiconductor device according to claim 1 , wherein

the semiconductor chip includes:

a drain electrode formed in the first face and connected to the first electrode via the joining material;

a source electrode formed in the second face and connected to the second electrode via the joining material; and

a gate electrode formed in the second face and connected to the third electrode via the joining material.

3 . The semiconductor device according to claim 1 , wherein

a number of the plurality of terminals of the second electrode is even,

the slit is formed between the adjacent two out of the terminals and positioned at a center in an alignment direction of the terminals, and

a number of the terminals separated from the slit in one direction of the alignment direction is equal to a number of the terminals separated from the slit in a direction opposite to the one direction.

4 . The semiconductor device according to claim 1 , wherein

a number of the plurality of terminals of the second electrode is odd,

the slit is formed between the adjacent two out of the terminals and positioned adjacent to a central terminal out of the plurality of terminals aligned, and

a number of the terminals separated from the slit in one direction of an alignment direction of the terminals is less by one than a number of the terminals separated from the slit in a direction opposite to the one direction.

5 . The semiconductor device according to claim 1 , wherein

the second electrode includes a plate base,

the plurality of terminals are formed to extend outside the plate base from an edge of the plate base, and

the slit is formed to extend inside the plate base from the edge of the plate base between the adjacent two out of the plurality of terminals.