Temperature sensor capable of determining whether to convert reference voltage to voltage digital code based on condition, and devices having the same

1 . A temperature sensor comprising:

a first selection circuit configured to output a selected temperature signal among temperature signals in response to a selection code;

a reference voltage generator configured to generate a reference voltage;

a control circuit configured to generate a control signal;

a second selection circuit configured to:

output both the reference voltage and the selected temperature signal in response to the control signal indicating that a voltage conversion condition is satisfied, and

output only the selected temperature signal in response to the control signal indicating that the voltage conversion condition is not satisfied; and

a converter configured to:

convert the reference voltage to a voltage digital code and the selected temperature signal to a temperature digital code in response to the control signal indicating that the voltage conversion condition is satisfied, and

convert only the selected temperature signal to the temperature digital code in response to the control signal indicating that the voltage conversion condition is not satisfied.

2 . The temperature sensor of claim 1 , further comprising:

a memory device configured to store a previous voltage digital code;

a third selection circuit configured to:

output the voltage digital code, received from the converter, in response to the control signal indicating that the voltage conversion condition is satisfied, and

output the previous voltage digital code stored in the memory device in response to the control signal indicating that the voltage conversion condition is not satisfied; and

an arithmetic circuit configured to generate an output temperature code using both the temperature digital code received from the converter and an output code received from the third selection circuit, wherein

the output code is either the voltage digital code or the previous voltage digital code.

3 . The temperature sensor of claim 2 , wherein the control circuit is configured to:

determine whether the temperature sensor is initially activated, and

generate the control signal indicating that the voltage conversion condition is satisfied in response to determining the temperature sensor is initially activated.

4 . The temperature sensor of claim 2 , wherein the control circuit is configured to:

determine an update period of the previous voltage digital code stored in the memory device based on the number of times an indication signal is received, the indication signal indicating that the output temperature code is output by the arithmetic circuit, and

generate the control signal indicating that the voltage conversion condition is satisfied every update period.

5 . The temperature sensor of claim 2 , wherein the control circuit is configured to:

determine whether the selection code is a code indicating an output of a main temperature signal output by a main temperature probe, and

generate the control signal indicating that the voltage conversion condition is satisfied in response to determining the selection code indicates the output of the main temperature signal.

6 . The temperature sensor of claim 2 , wherein in response to the voltage digital code being generated by the converter, the previous voltage digital code stored in the memory device is replaced by the voltage digital code.

7 . A system on chip (SoC) comprising:

local temperature sensors configured to generate local temperature signals; and

a temperature sensor connected to the local temperature sensors, wherein the temperature sensor includes:

a main temperature sensor configured to generate a main temperature signal,

a first selection circuit configured to output both a selected temperature signal among the local temperature signals and the main temperature signal in response to a selection code,

a reference voltage generator configured to generate a reference voltage,

a control circuit configured to generate a control signal,

a second selection circuit configured to:

output both the reference voltage and the selected temperature signal in response to the control signal indicating that a voltage conversion condition is satisfied; and

output only the selected temperature signal in response to the control signal indicating that the voltage conversion condition is not satisfied, and

a converter configured to:

convert both the reference voltage to a voltage digital code and the selected temperature signal to a temperature digital code in response to the control signal indicating that the voltage conversion condition is satisfied; and

convert only the selected temperature signal to the temperature digital code in response to the control signal indicating that the voltage conversion condition is not satisfied.

8 . The system on chip of claim 7 , further comprising:

a memory device configured to store a previous voltage digital code;

a third selection circuit configured to:

output the voltage digital code, received from the converter, in response to the control signal indicating that the voltage conversion condition is satisfied, and

output the previous voltage digital code, received from the memory device, in response to the control signal indicating that the voltage conversion condition is not satisfied; and

an arithmetic circuit configured to generate an output temperature code using both the temperature digital code received from the converter and an output code received from the third selection circuit, wherein

the output code is either the voltage digital code or the previous voltage digital code.

9 . The system on chip of claim 8 , wherein the control circuit is configured to:

determine whether the temperature sensor is initially activated, and

generate the control signal indicating that the voltage conversion condition is satisfied in response to determining the temperature sensor is initially activated.

10 . The system on chip of claim 8 , wherein the control circuit includes:

a counter configured to:

receive an indication signal indicating that the output temperature code is output, and

generate a count value of the number of times the indication signal is received; and

a comparator configured to:

compare the count value with a reference value, and

generate the control signal indicating that the voltage conversion condition is satisfied in response to the count value being equal to the reference value.

11 . The system on chip of claim 8 , wherein the control circuit is configured to:

determine an update period of the previous voltage digital code stored in the memory device based on the number of times an indication signal is received, the indication signal indicating that the output temperature code is output by the arithmetic circuit, and

generate the control signal indicating that the voltage conversion condition is satisfied every update period.

12 . The system on chip of claim 8 , wherein the control circuit includes:

a counter configured to:

receive an indication signal indicating that the output temperature code is output, and

generate a count value of the number of times the indication signal is received; and

a comparator configured to:

compare the count value with a reference count, and

generate the control signal indicating that the voltage conversion condition is satisfied in response to determining the count value is equal to the reference count, wherein

the reference count indicates an update period of the previous voltage digital code stored in the memory device.

13 . The system on chip of claim 8 , wherein the control circuit is configured to:

determine whether the selection code is a code indicating an output of the main temperature signal by a main temperature sensor, and

generate the control signal indicating that the voltage conversion condition is satisfied in response to determining the selection code indicates the output of the main temperature signal by the main temperature sensor.

14 . The system on chip of claim 8 , wherein:

the control circuit includes a comparator configured to:

compare a reference selection code with the selection code; and

generate the control signal indicating that the voltage conversion condition is satisfied in response to the reference selection code being equal to the selection code, and

the first selection circuit outputs the main temperature signal as the selected temperature signal in response to the selection code being identical to the reference selection code.

15 . The system on chip of claim 8 , wherein the control circuit includes a comparator configured to:

compare the previous voltage digital code with a reference code, and

generate the control signal indicating that the voltage conversion condition is satisfied in response to the previous voltage digital code being equal to the reference code.

16 . The system on chip of claim 8 , wherein:

the converter is a time-to-digital converter, and

in response to the voltage digital code being generated by the time-to-digital converter, the previous voltage digital code stored in the memory device is replaced by the voltage digital code.

17 . A temperature sensor comprising:

a control circuit that generates a first control signal; and

a converter that converts:

both a reference voltage to a voltage digital code and a temperature signal to a temperature digital code in response to the first control signal, and

only the temperature signal to the temperature digital code in the absence of the first control signal.

18 . The temperature sensor of claim 17 , wherein the control circuit generates the first control signal in response to determining an initialization condition of the temperature sensor exists.

19 . The temperature sensor of claim 17 , wherein the control circuit generates the first control signal in response to determining an update period of the temperature sensor has expired.

20 . The temperature sensor of claim 17 , wherein the control circuit generates the first control signal in response to determining the temperature signal is acquired from a predetermined reference temperature probe rather than another temperature probe.