Measuring wellhead displacement using beam deflection
Systems and methods for performing contactless wellhead displacement measurements in a desert environment include adjusting an alignment of optical components in an optical system based on a temperature of the optical system. A pattern of infrared light is projected from the optical system onto a portion of a wellhead, the infrared light having a wavelength away from water absorption wavelengths and solar maxima wavelengths. Reflections of the pattern of infrared light from the portion of the wellhead are captured using an imaging sensor of the optical system. A displacement of the wellhead is measured based on the projected pattern of infrared light and the reflections.
1 . A method for performing contactless wellhead displacement measurements in a desert environment, the method comprising:
adjusting an alignment of optical components in an optical system based on a temperature of the optical system;
projecting a pattern of infrared light from the optical system onto a portion of a wellhead, the infrared light having a wavelength away from water absorption wavelengths and solar maxima wavelengths;
capturing reflections of the pattern of infrared light from the portion of the wellhead using an imaging sensor of the optical system; and
measuring a displacement of the wellhead based on the projected pattern of infrared light and the reflections.
2 . The method of claim 1 , further comprising in response to determining that the displacement exceeds a threshold displacement, performing a corrective action.
3 . The method of claim 2 , wherein performing the corrective action comprises generating an alert that the displacement exceeds the threshold displacement.
4 . The method of claim 1 , wherein projecting the pattern of infrared light comprises transmitting infrared light through a diffractive optical element to form the pattern of infrared light.
5 . The method of claim 1 , wherein projecting the pattern of infrared light comprises controlling multiple infrared light sources to form the pattern of infrared light.
6 . The method of claim 1 , wherein the imaging sensor comprises an angle-sensitive complementary metal-oxide semiconductor (CMOS) sensor or an angle-sensitive charge coupled device (CCD) sensor.
7 . The method of claim 6 , further comprising determining a time of arrival and an angle of incidence of the reflection, wherein measuring the displacement is further based on the time of arrival and the angle of incidence of the reflection.
8 . The method of claim 1 , further comprising iteratively measuring displacements of the portion of the wellhead at multiple instances of time to generate a time-history of the displacements.
9 . The method of claim 8 , further comprising predicting anomalies of the wellhead using a machine learning model that takes as input the time-history of the displacements.
10 . A system for performing contactless wellhead displacement measurements in a desert environment, the system comprising:
an infrared light source to illuminate a portion of the wellhead, the infrared light source having a wavelength away from water absorption wavelengths and solar maxima wavelength;
a diffractive optical element to generate a pattern of light from the infrared light source;
an imaging sensor to capture the pattern of light reflected from the portion of the wellhead; and
a computer system configured to adjust an alignment of the infrared light source, the diffractive optical element and the imaging sensor based on a temperature of the system and measure a displacement of the wellhead based on the captured pattern of light.
11 . The system of claim 10 , wherein the infrared light source comprises a long wavelength infrared light source.
12 . The system of claim 11 , wherein the infrared light source comprises a wavelength in the range of 8 to 14 micrometers.
13 . The system of claim 10 , wherein the imaging sensor comprises an angle-sensitive complementary metal-oxide semiconductor (CMOS) sensor or an angle-sensitive charge coupled device (CCD) sensor.
14 . The system of claim 10 , wherein the infrared light source comprises a laser or a super luminescent diode.
15 . The system of claim 10 , wherein the pattern of light comprises a plurality of dots.
16 . The system of claim 10 , further comprising a bandpass filter coupled to the imaging sensor to filter undesired wavelengths from the pattern of light reflected from the portion of the wellhead.
17 . The system of claim 10 , wherein the computer system is further configured to:
project the pattern of infrared light onto the portion of the wellhead;
capture reflections of the pattern of infrared light from the portion of the wellhead using the imaging sensor; and
measure the displacement of the wellhead based on the projected pattern of infrared light and the reflections.
18 . The system of claim 17 , wherein the imaging sensor comprises an angle-sensitive complementary metal-oxide semiconductor (CMOS) sensor or an angle-sensitive charge coupled device (CCD) sensor; and
wherein the computer system is further configured to determine a time of arrival and an angle of incidence of the reflection, wherein measuring the displacement is further based on the time of arrival and the angle of incidence of the reflection.
19 . The system of claim 17 , wherein the computer system is further configured to iteratively measure displacements of the portion of the wellhead at multiple instances of time to generate a time-history of the displacements.
20 . The system of claim 19 , wherein the computer system is further configured to predict anomalies of the wellhead using a machine learning model that takes as input the time-history of the displacements.