Method of evaluating a sample using charged particle microscopy
The invention relates to a method of evaluating a sample using charged particle microscopy, comprising the steps of a sample containing primary particles of interest. The method further comprises the steps of imaging said sample using said charged particle microscope for obtaining at least one image of said primary particles; and determining a concentration of said primary particles using said at least one image. As defined herein, the sample further contains secondary particles that are independent from said primary particles, and which are present in said at least one image. The method is characterized by the steps of providing a known concentration of said secondary particles and using said known concentration of said secondary particles in said step of determining said concentration of said primary particles.
1 . Method of evaluating a sample using a charged particle microscopy, comprising the steps of:
providing a sample containing primary particles of interest;
imaging said sample using a charged particle microscope for obtaining at least one image of said primary particles; and
determining a concentration of said primary particles using said at least one image,
further comprising the step of preparing said sample by
providing said primary particles and secondary particles in at least one solution,
providing a sample carrier,
applying said at least one solution to said sample carrier, and
vitrifying said solution on said sample carrier.
2 . Method according to claim 1 , wherein the concentration of said primary particles is determined using the number of primary particles in said image.
3 . Method according to claim 1 , wherein volumetric data of said image is used in determining said concentration of said primary particles based on at least one or more of the following: image size, a magnification setting of said charged particle microscope, and a thickness of said sample.
4 . Method according to claim 3 , wherein said sample is a cryo-EM sample, wherein the thickness of the sample is related to the ice thickness of said cryo-EM sample.
5 . Method according to claim 1 , wherein said image further contains secondary particles that are independent from said primary particles and that have a known concentration, wherein the method further comprises the step of using said known concentration of said secondary particles in said step of determining said concentration of said primary particles.
6 . Method according to claim 5 , wherein said secondary particles comprise gold nanoparticles.
7 . Method according to claim 5 , wherein said step of providing said concentration comprises the step of using a supplier data sheet of said secondary particles.
8 . Method according to claim 5 , further comprising the step of using an absorption technique for providing said concentration of said secondary particles.
9 . Method according to claim 5 , wherein said step of determining said concentration of said primary particles comprises the steps of:
determining at least one preliminary concentration of said primary particles; and
subsequently determining a final concentration of said primary particles using said provided concentration of said secondary particles.
10 . Method according to claim 5 , wherein a ratio between a number of secondary particles in said at least one image and a number of primary particles in said image is used for determining said concentration of said primary particles.
11 . Method according to claim 5 , further comprising a calibration step to account for losses of secondary particles during preparation of said sample.
12 . Method according to claim 1 , wherein said primary particles comprise viral particles.
13 . Method according to claim 1 , further comprising the step of mixing said primary particles and said secondary particles into a single solution.
14 . Method according to claim 1 , further comprising the step of determining at least one further parameter of the sample.
15 . A charged particle microscope comprising:
a processor unit configured to:
provide a sample containing primary particles of interest;
image said sample using the charged particle microscope for obtaining at least one image of said primary particles; and
determine a concentration of said primary particles using said at least one image,
wherein volumetric data of said image is used in determining said concentration of said primary particles based on at least one or more of the following: image size, a magnification setting of said charged particle microscope, and a thickness of said sample, and
wherein said sample is a cryo-EM sample, wherein the thickness of the sample is related to the ice thickness of said cryo-EM sample.
16 . The charged particle microscope of claim 15 , wherein the concentration of said primary particles is determined using the number of primary particles in said image.
17 . Method of evaluating a sample using a charged particle microscopy, comprising the steps of:
providing a sample containing primary particles of interest;
imaging said sample using a charged particle microscope for obtaining at least one image of said primary particles; and
determining a concentration of said primary particles using said at least one image,
wherein said image further contains secondary particles that are independent from said primary particles and that have a known concentration, wherein the method further comprises the step of using said known concentration of said secondary particles in said step of determining said concentration of said primary particles, and
wherein said step of determining said concentration of said primary particles comprises the steps of:
determining at least one preliminary concentration of said primary particles; and
subsequently determining a final concentration of said primary particles using said provided concentration of said secondary particles.
18 . Method according to claim 17 , wherein volumetric data of said image is used in determining said concentration of said primary particles based on at least one or more of the following: image size, a magnification setting of said charged particle microscope, and a thickness of said sample.
19 . Method according to claim 18 , wherein said sample is a cryo-EM sample, wherein the thickness of the sample is related to the ice thickness of said cryo-EM sample.
20 . Method according to claim 17 , wherein said image further contains secondary particles that are independent from said primary particles and that have a known concentration, wherein the method further comprises the step of using said known concentration of said secondary particles in said step of determining said concentration of said primary particles.