Correction apparatus, correction method, and correction program

1 . A correction apparatus for correcting a profile of X-ray powder diffraction, comprising:

processing circuitry configured to

set a reference profile,

set an estimation method for estimating a correction amount related to a sample height,

estimate the correction amount based on the estimation method, and

correct a subject profile based on the correction amount, wherein

the correction amount is a value that maximizes a degree of coincidence between the corrected subject profile and the reference profile.

2 . The correction apparatus according to claim 1 , wherein the processing circuitry is further configured to

correct the subject profile with a temporary correction amount, and

calculate the correction amount by repeating evaluation of a degree of coincidence between the subject profile corrected based on the temporary correction amount and the reference profile.

3 . The correction apparatus according to claim 1 , wherein the processing circuitry is further configured to

set the reference profile based on a profile designated by a user.

4 . The correction apparatus according to claim 1 , wherein the processing circuitry is further configured to

set the reference profile calculated based on a plurality of profiles.

5 . The correction apparatus according to claim 1 , wherein the processing circuitry is further configured to

set a least-square method or a peak-top method as the estimation method.

6 . The correction apparatus according to claim 1 , wherein the processing circuitry is further configured to

set a 2θ angle range in which the degree of coincidence is maximized based on a designation of a user.

7 . The correction apparatus according to claim 1 , wherein the processing circuitry is further configured to

display a profile obtained by correcting the subject profile based on the temporary correction amount or the correction amount.

8 . The correction apparatus according to claim 2 , where the processing circuitry is further configured to

display a profile obtained by correcting the subject profile based on the temporary correction amount.

9 . The correction apparatus according to claim 1 , wherein

the following formula (1) is used based on the goniometer radius R and the correction amount D relating to the sample height when the angle 2θ of the profile is converted into the corrected angle 2θcorr.

2

⁢

θ

corr

=

2

⁢

θ

-

(

2

⁢

D

/

R

)

⁢

cos

⁢

θ

(

1

)

10 . The correction apparatus according to claim 1 , wherein a target of qualitative analysis is generated by correcting the subject profile based on the correction amount.

11 . The correction apparatus according to claim 1 , wherein a target of component decomposition is generated by correcting the subject profile based on the correction amount.

12 . A correction method for correcting a profile of X-ray powder diffraction, comprising the steps of:

setting a reference profile,

setting an estimation method for estimating a correction amount related to a sample height,

estimating the correction amount based on the estimation method, and correcting a subject profile based on the correction amount, wherein

the correction amount is a value that maximizes a degree of coincidence between the corrected subject profile and the reference profile.

13 . A non-transitory computer-readable recording medium having recorded thereon computer-readable instructions for correcting a profile of X-ray powder diffraction which, when executed by a computer, cause the computer to perform a method, the method comprising:

setting a reference profile,

setting an estimation method for estimating a correction amount related to a sample height,

estimating the correction amount based on the estimation method, and

correcting a subject profile based on the correction amount, wherein

the correction amount is a value that maximizes a degree of coincidence between the corrected subject profile and the reference profile.