IP Library Granted Patent US 12669522
Granted Patent B2
US 12669522 · App. 18/516,990 · Granted Jun 30, 2026

Test apparatus and battery production line

Inventors: Jun Yang (Ningde, CN); Shunlin Liao (Ningde, CN); Wei Cao (Ningde, CN)
Assignee: CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
G01R1/07314G01R1/07364G01R1/26
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Quick Facts
Patent No.
US 12669522
App. No.
18/516,990
Granted
Jun 30, 2026
Kind
B2
Abstract

This application provides a test apparatus and a battery production line. The test apparatus includes a fixing mechanism and a plurality of test probe mechanisms. The test probe mechanisms are slidably connected to the fixing mechanism side by side along a first direction. In the test apparatus provided in embodiments of this application, the fixing mechanism is provided with a plurality of test probe mechanisms, and the test probe mechanisms can slide along the first direction relative to the fixing mechanism. In this way, distances between the test probe mechanisms can be adaptively adjusted according to the dimensions of to-be-tested battery cells, that is, the distances can quickly respond and adapt to changes in dimensions of incoming battery cells, so that the test efficiency can be significantly improved.

Claims (22)

1 . A test apparatus for testing incoming battery cells, characterized by comprising:

a fixing structure; and

a plurality of test probe structures, wherein the test probe structures are slidably connected to the fixing structure side by side along a first direction,

wherein the test apparatus further comprises a synchronizer, wherein the synchronizer comprises a synchronization structure that is connected to the test probe structures and a driver that drives the synchronization structure to move relative to the fixing structure, and the synchronization structure drives, during movement relative to the fixing structure, the test probe structures to slide synchronously,

wherein the synchronization structure is slidably connected to the fixing structure in a second direction, the synchronization structure comprises a plate structure comprising a plurality of guide slots extending in a plane where the first direction and the second direction are located corresponding to the probe structures and each of the test probe structures is provided with a limiting structure slidably connected to the guide slot, the second direction being perpendicular to the first direction, and

wherein the driver comprises a first fixed portion, a second fixed portion, a screw rod portion with two ends connected to the first fixed portion and the second fixed portion respectively, and a nut portion threadedly connected to the screw rod portion, wherein the first fixed portion and the second fixed portion are spaced apart from each other along the second direction on the fixing structure, and the nut portion is fixedly connected to the synchronization structure.

2 . The test apparatus according to claim 1 , wherein each of the test probe structures is capable of independently sliding along the first direction relative to the fixing structure.

3 . The test apparatus according to claim 1 , wherein at least some of the test probe structures slide synchronously along the first direction relative to the fixing structure.

4 . The test apparatus according to claim 3 , wherein the test probe structures slide synchronously along the first direction relative to the fixing structure and are arranged equidistantly.

5 . The test apparatus according to claim 1 , wherein the test apparatus comprises a sliding structure, wherein the sliding structure comprises a guide rail provided on the fixing structure and sliders provided on corresponding test probe structures, the sliders being slidably connected to the guide rail.

6 . The test apparatus according to claim 1 , wherein the guide slot is provided with a first slot end and a second slot end, and the limiting structure slides reciprocally between the first slot end and the second slot end.

7 . The test apparatus according to claim 6 , wherein distances between first slot ends of any adjacent two of the guide slots are equal; and/or distances between second slot ends of any adjacent two of the guide slots are equal.

8 . The test apparatus according to claim 1 , wherein the guide slots are disposed in mirror symmetry with respect to the central axis of the screw rod portion.

9 . The test apparatus according to claim 8 , wherein the test apparatus further comprises a driving structure, wherein a fixed end of the driving structure is connected to the support frame, an output end of the driving structure mechanism is connected to the fixing structure, and the driving structure drives the fixing structure to reciprocate along the second direction relative to the support frame.

10 . The test apparatus according to claim 1 , wherein the test apparatus further comprises a support frame, wherein the fixing structure is slidably connected to the support frame and capable of sliding along a second direction relative to the support frame.

11 . The test apparatus according to claim 1 , wherein each of the test probe structures comprises a connector slidably connected to the fixing structure and two test structures connected to an end of the connector away from the fixing structure.

12 . The test apparatus according to claim 11 , wherein at least one of the test structures is slidably connected to the connector in a third direction, the third direction being perpendicular to the first direction.

13 . The test apparatus according to claim 11 wherein the connector comprises a vertical portion slidably connected to the fixing structure and a horizontal portion perpendicularly connected to the vertical portion, and the test structures are fitted on the horizontal portion and slide relative to the horizontal portion.

14 . The test apparatus according to claim 11 , wherein each of the two test structures comprises a test body and a probe provided on the test body, wherein the test body is slidably connected to the connector, one end of the probe abuts against an electrode terminal of the battery cell, and the other end of the probe is electrically connected to an external test device.

15 . The test apparatus according to claim 14 , wherein at least two probes are provided, and the probes are spaced apart along the first direction.

16 . The test apparatus according to claim 11 wherein the test probe structure further comprises lockers for locking the test structures, wherein the locker is inserted through the test structure member and capable of abutting against the connector connecting member.

17 . A battery production line, characterized by comprising the test apparatus according to claim 1 .