Acousto-optic system
A laser scanning microscopy system includes a laser whose beam is modified by an acousto-optic deflector that includes an optical element having a surface with one or more steps formed thereon; a conductive layer formed on the surface with the steps; one or more crystals secured to each step; and electrodes positioned on each surface of each crystal.
1 . A system comprising:
a laser for providing a light source;
a scanning system for scanning the laser beam across a sample;
a detector for detecting emitted light from the sample; and
a phased array acousto-optic deflector (AOD) for controlling the direction and intensity of the laser beam, wherein the AOD includes an optical element having a surface with one or more steps formed thereon, a conductive layer formed on the surface with the steps, and one or more crystals secured to each step.
2 . The system of claim 1 , wherein the AOD comprises multiple AODs operating at different frequencies to achieve high-speed and accurate beam steering.
3 . The system of claim 1 , wherein the AOD delivers light to specific regions of a sample for performing optogenetics.
4 . The system of claim 1 , wherein the AOD controls the laser beam intensity and timing and performs fluorescence lifetime imaging microscopy (FLIM).
5 . The system of claim 1 , wherein the AOD is used for performing stimulated emission depletion (STED) microscopy by modulating the laser beam intensity to create super-resolution images.
6 . The system of claim 1 , wherein the AOD is used for performing two-photon excitation microscopy (2PEM) by controlling the laser beam intensity and frequency to excite fluorophores deep within a sample.
7 . The system of claim 1 , further comprising an adaptive optics system for correcting for aberrations in the laser beam path or a confocal system for reducing out-of-focus light and improving image contrast.
8 . The system of claim 1 , comprising a tuning element to match a predetermined impedance.
9 . The system of claim 1 , comprising a tuning element providing an output impedance of 50 ohms.
10 . The system of claim 1 , comprising a tuning element including inductive and capacitive passive components.
11 . The system of claim 1 , comprising a tuning element that comprises 1:1 balun, 4:1 transformer, a capacitor, and an inductor.
12 . The system of claim 1 , wherein an optical element comprises a slanted end.
13 . The system of claim 12 , wherein the slanted end comprises a compound angle to move reflected sound field out of a laser beam working range.
14 . The system of claim 12 , wherein the slanted end forms a 30 degree angle measured from a long side of the optical element to a short side of the optical element.
15 . The system of claim 12 , wherein a surface of the slanted end comprises a 2 degree slope.
16 . The system of claim 12 , wherein the optical element comprises germanium, tellurium dioxide (TeO2), lithium niobate, PZT, fused silica, chalcogenide glasses, or glass.
17 . The system of claim 12 , wherein the optical element comprises a slanted end, wherein the slanted end comprises a compound angle to move reflected sound field out of a laser beam working range, wherein the slanted end forms a 30 degree angle measured from a long side of the optical element to a short side of the optical element, and wherein a surface of the slanted end comprises a 2 degree slope, and wherein the optical element comprises germanium, tellurium dioxide (TeO2), lithium niobate, PZT, fused silica, chalcogenide glasses, or glass.
18 . The system of claim 1 , wherein a tuning element matches a deflector output impedance at 40 MHz and at 60 MHz to a 50 ohm impedance.
19 . A method to perform microscopy, comprising:
providing a light source with a laser;
controlling the direction and intensity of the laser beam using a phased array AOD with one or more steps, a conductive layer formed on the surface with the steps, and one or more crystals secured to each step;
scanning the laser beam across a sample;
detecting emitted light from the sample to generate an image of the sample;
applying the laser beam to an optical element having one or more steps each with a predetermined height and one or more crystals or transducers on the one or more steps;
impedance matching the electrical input of the transducers to a predetermined impedance load;
providing an electrical input to deflect the laser at the two or more frequencies; and
generating a sound field in the optical element to deflect a laser beam based on two or more frequencies.