IP Library Granted Patent US 12669757
Granted Patent B2
US 12669757 · App. 18/224,063 · Granted Jun 30, 2026

Mask inspection apparatus with a platform module

Inventor: Ming-Sheng Chen (New Taipei City, TW)
G03F7/70825G03F1/84G03F7/70716G03F7/7085
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Quick Facts
Patent No.
US 12669757
App. No.
18/224,063
Granted
Jun 30, 2026
Kind
B2
Abstract

A mask inspection machine includes a platform unit for carrying a transparent container. The transparent container includes a lower window and an upper window. The platform unit includes a platform and a carrier. The platform includes a slot. The carrier is movable on the platform along the slot. The carrier includes a plate and guiding elements. The plate includes a support face including an inspection window corresponding to the lower window of the transparent container. The guiding elements are connected to the support face for guiding the transparent container onto the support face.

Claims (18)

1 . A platform unit of a mask inspection machine for carrying a transparent container formed with a lower window and an upper window, the platform unit comprising:

a platform comprising a slot; and

a carrier movable on the platform along the slot, wherein the carrier comprising

a plate comprising a support face comprising an inspection window corresponding to the lower window of the transparent container; and

guiding elements connected to the support face for guiding the transparent container onto the support face.

2 . The carrier according to claim 1 , wherein guiding elements are located at corners of the support face.

3 . The carrier according to claim 1 , wherein the carrier further comprises a sensor on the support face to detect whether a lower face of the transparent container is in proper contact with the support face.

4 . The carrier according to claim 1 , wherein the carrier further comprises a first positioning boss, a second positioning boss and a third positioning boss arranged in a triangle on the support face within the guiding elements, wherein the first, second and third positioning bosses are insertable in three bores made in the transparent container.

5 . The carrier according to claim 4 , wherein the shortest distance of the first positioning boss from a line between the second and third positioning bosses is 172 to 173.5 mm, wherein a distance between the second and third positioning bosses is 157.8 to 158.8 mm.

6 . The carrier according to claim 5 , wherein the shortest distance of the first positioning boss from a line between the second and third positioning bosses is 172.9±0.1 mm, wherein a distance between the second and third positioning bosses is 158.21±0.1 mm.

7 . The carrier according to claim 1 , wherein the platform comprises, on a lower face, two tracks along which the carrier is movable.

8 . The carrier according to claim 1 , wherein the platform unit further comprises a lateral light source module comprising two light boxes on two opposite sides of the slot of the platform, wherein each of the light boxes is operable to cast light onto transparent container on the carrier.

9 . The carrier according to claim 8 , wherein each of the light boxes is operable to cast light onto transparent container on the carrier at an angle of 0 to 6 degrees.

10 . The carrier according to claim 8 , wherein each of the light boxes comprises a slit through which the light box casts light in the form of a curtain.

11 . The carrier according to claim 8 , wherein the lateral light source module further comprises two columns for movably supporting the light boxes.

12 . The carrier according to claim 11 , wherein the lateral light source module further comprises two vertical planks movably connected to the columns respectively, wherein the light boxes are pivotally connected to the vertical planks respectively.

13 . The carrier according to claim 11 , wherein each of the lateral light source module further comprises pivots connected to portions of a corresponding one of the vertical planks.

14 . A mask inspection machine comprising the platform module of claim 1 and a first inspection unit for inspecting the lower face of the mask and a second inspection unit for inspecting the upper face of the mask.