Device security with physically unclonable functions
An electronic device may include a printed circuit board having a physically unclonable function (PUF) source. The PUF source includes a plurality of fuses that provide PUF data based on a measurement of electrical parameters resulting from a first signal being transmitted through the plurality of fuses. The electronic device also has processing circuitry in communication with the PUF source that can detect a triggering event at the electronic device and determine an event type based on the detected triggering event. The processing circuitry can select at least one fuse of the plurality of fuses based on the determined event type and change an electrical property of the selected at least one fuse such that the PUF data from the PUF source is modified.
1 . A method for modifying a physically unclonable function (PUF) source of a device, the PUF source having a plurality of fuses embedded in the device, the method comprising:
detecting a triggering event at the device;
determining, with processing circuitry of the device, an event type based on the detected triggering event;
selecting, with the processing circuitry, at least one fuse of the plurality of fuses based on the determined event type, wherein the selected at least one fuse includes a dielectric layer; and
changing an electrical property of the selected at least one fuse such that an output of the PUF source is modified, wherein changing the electrical property of the selected at least one fuse includes lowering a resistance of the selected at least one fuse in response to transmission of a signal to the selected at least one fuse, and wherein a voltage of the signal exceeds a breakdown voltage of the dielectric layer.
2 . The method of claim 1 , wherein the electrical property is the resistance.
3 . The method of claim 1 , wherein the signal has a current that is sufficiently high to change the electrical property.
4 . The method of claim 1 , wherein the signal has a voltage that is sufficiently high to change the electrical property.
5 . The method of claim 1 , wherein lowering the resistance of the selected at least one fuse includes transmitting the signal.
6 . The method of claim 1 , wherein the selected at least one fuse includes a layer of amorphous silicon, and wherein the voltage of the signal is sufficiently high to convert the amorphous silicon to a polycrystalline silicon-metal alloy.
7 . The method of claim 1 , wherein selecting the at least one fuse of the plurality of fuses includes predefining the selection of the at least one fuse of the plurality of fuses based on the triggering event being an attempt to tamper with the device.
8 . The method of claim 1 , wherein selecting the at least one fuse of the plurality of fuses includes selecting each fuse of the plurality of fuses.
9 . The method of claim 1 , wherein selecting the at least one fuse of the plurality of fuses includes randomly selecting the at least one fuse of the plurality of fuses.
10 . An electronic device, comprising:
a physically unclonable function (PUF) source having a plurality of fuses, the PUF source responsive to an input to provide PUF data based on a measurement of an electrical parameters resulting from a first signal being transmitted through the plurality of fuses; and
processing circuitry in communication with the PUF source, the processing circuitry configured to process the PUF data from the PUF source to perform an operation within the electronic device, the processing circuitry configured to detect a triggering event at the electronic device and determine an event type based on the detected triggering event, the processing circuitry configured to select at least one fuse of the plurality of fuses based on the determined event type, wherein the selected at least one fuse includes a dielectric layer, the processing circuitry configured to change an electrical property of the selected at least one fuse such that the PUF data from the PUF source is modified by lowering a resistance of the selected at least one fuse in response to transmission of a second signal to the selected at least one fuse, and wherein a voltage of the second signal exceeds a breakdown voltage of the dielectric layer.
11 . The electronic device of claim 10 , wherein the second signal has a current that is sufficiently high to change the resistance of the selected at least one fuse.
12 . The electronic device of claim 10 , wherein each fuse of the plurality of fuses has a respective dielectric layer, and wherein the PUF data is based on a thickness of the dielectric layer.
13 . The electronic device of claim 10 , wherein the processing circuitry transmits the second signal to the selected at least one fuse.
14 . The electronic device of claim 10 , wherein the PUF data includes a one-bit PUF value corresponding to each fuse of the plurality of fuses based on comparisons of the measured electrical parameter from each fuse to a threshold value, and wherein the dielectric layer of the selected at least one fuse has a thickness such that there is an approximately 50% chance of a change in the one-bit PUF value corresponding to the selected at least one fuse after the transmission of the second signal to the selected at least one fuse.
15 . The electronic device of claim 10 , wherein the selected at least one fuse includes a layer of amorphous silicon, and wherein the voltage of the second signal transmitted to the selected at least one fuse is sufficiently high to convert the amorphous silicon to a polycrystalline silicon-metal alloy such that the resistance of the selected at least one fuse is lowered.
16 . The electronic device of claim 10 , wherein the processing circuitry is configured to select predefined fuses of the plurality of fuses based on the triggering event being an attempt to tamper with the device, wherein the predefined fuses include the selected at least one fuse.
17 . The electronic device of claim 10 , wherein the processing circuitry is configured to:
select the at least one fuse of the plurality of fuses in response to the determined event type; or
randomly select the at least one fuse of the plurality of fuses in response to the determined event type.
18 . A method for use with an electronic device including a printed circuit board with a physically unclonable function (PUF) source, the method comprising:
providing, by the PUF source, PUF data to processing circuitry of the electronic device, the PUF data being generated from a measurement of electrical parameters from a plurality of fuses of the PUF source in response to a first signal being transmitted through the plurality of fuses;
detecting a triggering event at the electronic device;
determining, with processing circuitry of the electronic device, an event type based on the detected triggering event;
selecting, with the processing circuitry, at least one fuse of the plurality of fuses based on the determined event type; and
changing an electrical property of the selected at least one fuse by transmitting a second signal of sufficiently high current or voltage to the selected at least one fuse such that a resistance of the selected at least one fuse is lowered and such that the PUF data from the PUF source is modified.
19 . The method of claim 18 , wherein the electrical property is the resistance.
20 . The method of claim 18 , wherein the PUF data includes a one-bit PUF value corresponding to each fuse of the plurality of fuses based on comparisons of the measured electrical parameter from each fuse to a threshold value, and wherein the selected at least one fuse includes a dielectric layer with a thickness such that there is an approximately 50% chance of a change in the one-bit PUF value corresponding to the selected at least one fuse after the second signal is transmitted to the selected at least one fuse.