Systems, apparatuses, and methods for inspecting inner surfaces of holes using pixel-intensity analysis
An inspection system includes a scanner and a computing device. The scanner is configured to scan an inner surface of a hole in an object. The scanner is configured to generate a plurality of images. Each one of the images represents one of a plurality of sections of the inner surface of the hole. The computing device is coupled to the scanner to receive the plurality of images. The computing device is programmed to combine the plurality of images to form an image. The image represents the inner surface of the hole. The computing device is programmed to evaluate a surface characteristic of the inner surface based on pixel-intensity values of the image.
1 . An inspection system comprising:
a scanner configured to scan an inner surface of a hole and to generate a plurality of images, wherein each one of the images represents one of a plurality of sections of the inner surface, and wherein at least a portion of the scanner is configured to be inserted into the hole; and
a processor coupled to the scanner to receive the plurality of images, wherein the processor is programmed to:
determine a reflection angle of the scanner based on a known curvature of the inner surface;
combine the plurality of images to form an image that represents the inner surface of the hole;
determine pixel-intensity values of pixels of the image, wherein the pixel-intensity values represent optical reflectivity of the inner surface;
compensate for variations in the optical reflectivity of the inner surface due to a curvature of the inner surface by:
comparing the pixel-intensity values represented in the image to a reference-intensity value; and
upscaling or downscaling one or more of the pixel-intensity values represented in the image based on the reference-intensity value and the reflection angle of the scanner and the inner surface of the hole to generate compensated pixel-intensity values; and
evaluate the inner surface to distinguish between coated surface area and uncoated surface area based on the compensated pixel-intensity values of the image by comparing the compensated pixel-intensity values to a threshold-intensity value, wherein the compensated pixel-intensity values represent the optical reflectivity of the inner surface compensated for variations due to the curvature.
2 . The inspection system of claim 1 , wherein
the processor is further programmed to
determine a presence of a surface coating based on the comparison of the compensated pixel-intensity values to the threshold-intensity value.
3 . The inspection system of claim 2 , wherein the processor is further programmed to determine a percentage of the inner surface that comprises the surface coating.
4 . The inspection system of claim 1 , wherein the processor is further programmed to segment the image into a plurality of image segments based on similarities of the compensated pixel-intensity values of pixels in a region of the image.
5 . The inspection system of claim 1 , wherein the processor is further programmed to flatten the image.
6 . The inspection system of claim 1 , wherein the scanner comprises an endoscopic scanner that is configured to be inserted within the hole.
7 . The inspection system of claim 1 , wherein the scanner comprises a structured light scanner.
8 . The inspection system of claim 1 , wherein the processor is further programmed to quantify surface coverage represented by a ratio of the coated surface area to the uncoated surface area.
9 . The inspection system of claim 2 , wherein the processor is further programmed to qualify the inner surface based on the presence of the surface coating.
10 . An inspection method comprising:
capturing a plurality of images of an inner surface of a hole;
combining the images to form an image that represents the inner surface of the hole;
determining pixel-intensity values of pixels of the image, wherein the pixel-intensity values represent optical reflectivity of the inner surface;
compensating for variations in the optical reflectivity of the inner surface due to a curvature of the inner surface by:
comparing the pixel-intensity values represented in the image to a reference-intensity value; and
upscaling or downscaling one or more of the pixel-intensity values represented in the image based on the reference-intensity value and a reflection angle of the scanner and the inner surface of the hole to generate compensated pixel-intensity values; and
evaluating the inner surface to distinguish between coated surface areas and uncoated surface areas based on the compensated pixel-intensity values of the image by comparing the compensated pixel-intensity values to a threshold-intensity value, wherein the compensated pixel-intensity values represent the optical reflectivity of the inner surface compensated for variations due to the curvature.
11 . The inspection method of claim 10 , wherein
evaluating the inner surface further comprises
determining a presence of a surface coating based on a comparison of the compensated pixel-intensity values to the threshold-intensity value.
12 . The inspection method of claim 11 , further comprising determining a percentage of the inner surface that comprises the surface coating.
13 . The inspection method of claim 10 , further comprising segmenting the image into a plurality of image segments based on similarities of the pixel-intensity values of pixels in a region of the image.
14 . The inspection method of claim 11 , wherein evaluating the inner surface further comprises qualifying the inner surface based on the presence of the surface coating.
15 . The inspection method of claim 11 , wherein evaluating the inner surface further comprises quantifying surface coverage represented by a ratio of the coated surface area to the uncoated surface area.
16 . A data processing system comprising:
a processor; and
a memory storing program code that, when executed by the processor, causes the processor to:
receive a plurality of images that represent a plurality of sections of an inner surface of a hole in an object;
determine a reflection angle of the scanner based on a known curvature of the inner surface;
combine the images to form an image that represents the inner surface of the hole;
determine pixel-intensity values of pixels of the image, wherein the pixel-intensity values represent optical reflectivity of the inner surface;
compensate for variations in the optical reflectivity of the inner surface due to a curvature of the inner surface by:
comparing the pixel-intensity values represented in the image to a reference-intensity value; and
upscaling or downscaling one or more of the pixel-intensity values represented in the image based on the reference-intensity value and the reflection angle of the scanner and the inner surface of the hole to generate compensated pixel-intensity values; and
evaluate the inner surface to distinguish between coated surface areas and uncoated surface areas based on the compensated pixel-intensity values of the image by comparing the compensated pixel-intensity values to a threshold-intensity value, wherein the compensated pixel-intensity values represent the optical reflectivity of the inner surface compensated for variations due to the curvature.
17 . The data processing system of claim 16 , wherein:
the program code, when executed by the processor, further causes the processor to determine a presence of a surface coating based on the comparison of the pixel-intensity values to the threshold-intensity value.
18 . The data processing system of claim 16 , wherein the program code, when executed by the processor, further causes the processor to segment the image into a plurality of image segments based on similarities of the compensated pixel-intensity values of pixels in a region of the image.
19 . The data processing system of claim 17 , wherein the program code, when executed by the processor, further causes the processor to qualify the inner surface based on the presence of the surface coating.
20 . The data processing system of claim 17 , wherein the program code, when executed by the processor, further causes the processor to quantify surface coverage represented by a ratio of the coated surface area to the uncoated surface area.