NAND detect empty page scan using subsets of wordlines on a page

1 . A memory device, comprising:

one or more components configured to:

identify a plurality of word line groups, included in a block of a memory of the one or more components, that include erased pages of the block;

determine, for a word line group of the plurality of word line groups, whether an erased threshold voltage of a tail portion of an erased threshold voltage distribution for the word line group satisfies a voltage threshold; and

determine whether a NAND detect empty page (NDEP) scan operation passed or failed based on whether the erased threshold voltage of the tail portion of the erased threshold voltage distribution for the word line group satisfies the voltage threshold.

2 . The memory device of claim 1 ,

wherein the word line group has a lowest erased margin of the plurality of word line groups.

3 . The memory device of claim 1 ,

wherein the voltage threshold is based on one or more parameters associated with the word line group.

4 . The memory device of claim 3 ,

wherein the one or more parameters comprise:

an operating temperature of memory cells associated with the word line group.

5 . The memory device of claim 3 ,

wherein the one or more parameters comprise:

a quantity of program-erase cycles (PECs) that are accumulated for memory cells associated with the word line group.

6 . The memory device of claim 3 ,

wherein the one or more parameters comprise:

a memory cell type of memory cells associated with the word line group.

7 . The memory device of claim 3 ,

wherein the one or more parameters comprise:

a location, in the memory, of memory cells associated with the word line group.

8 . The memory device of claim 7 ,

wherein the memory cells are located in a bottom-most deck in the memory.

9 . The memory device of claim 1 ,

wherein the one or more components are configured to:

identify the word line group based upon a location, in the memory, of memory cells associated with the word line group.

10 . A memory device, comprising:

a memory; and

a controller configured to:

identify a plurality of word line groups, included in a block of the memory, that include erased pages of the block;

test the plurality of word line groups to determine a respective charge gain for each word line group of the plurality of word line groups;

determine that an erased threshold voltage distribution of a subset of word line groups of the plurality of word line groups satisfies a threshold based on the subset of word line groups being associated with a greatest amount of charge gain and the test; and

perform an empty page scan for the subset of word line groups.

11 . The memory device of claim 10 ,

wherein memory cells associated with the subset of word line groups are located in a bottom-most deck in the memory.

12 . The memory device of claim 10 ,

wherein the controller is configured to:

determine the threshold based on an operating temperature of memory cells associated with the plurality of word line groups.

13 . The memory device of claim 10 ,

wherein the controller is configured to:

determine the threshold based on a quantity of program-erase cycles (PECs) accumulated for memory cells associated with the plurality of word line groups.

14 . The memory device of claim 10 ,

wherein the controller is configured to:

determine the threshold based on a memory cell type for memory cells associated with the plurality of word line groups.

15 . The memory device of claim 10 ,

wherein the controller is configured to:

determine an offset voltage for the subset of word line groups;

determine a voltage threshold for the subset of word line groups based on the offset voltage; and

perform the empty page scan to determine whether an erased threshold voltage for the subset of word line groups satisfies the voltage threshold.

16 . The memory device of claim 15 ,

wherein the controller is configured to:

determine the offset voltage based on at least one of:

an operating temperature of memory cells associated with the plurality of word line groups,

a quantity of program-erase cycles (PECs) accumulated for the memory cells associated with the plurality of word line groups, or

a memory cell type for the memory cells associated with the plurality of word line groups.

17 . A method, comprising:

determining, by a controller of a memory device, an offset voltage for a NAND detect empty page (NDEP) scan,

wherein the offset voltage is determined based on one or more parameters associated with an erased page of a block included in a memory of the memory device, and

wherein a magnitude of the offset voltage decreases as a quantity of program-erase cycles (PECs) accumulated for memory cells associated with the erased page increases;

determining, by the controller, a voltage threshold for the NDEP scan based on the offset voltage; and

performing, by the controller, the NDEP scan for the erased page based on the voltage threshold.

18 . The method of claim 17 ,

wherein the one or more parameters comprise:

an operating temperature of the erased page.

19 . The method of claim 18 ,

wherein a magnitude of the offset voltage increases as the operating temperature of the erased page increases.

20 . The method of claim 17 ,

wherein the one or more parameters comprise:

the quantity of PECs.

21 . The method of claim 17 ,

wherein the one or more parameters comprise:

a memory cell type of memory cells associated with the erased page.

22 . The method of claim 17 ,

wherein the one or more parameters comprise:

a location, in the memory, of memory cells associated with the erased page.

23 . The method of claim 17 ,

wherein determining the voltage threshold comprises:

applying the offset voltage to a read voltage of the erased page to determine the voltage threshold.

24 . The method of claim 17 , further comprising:

determining an erased threshold voltage threshold based on a memory cell type for one or more memory cells of the memory device.