Radio frequency device calibration method
An embodiment of the invention provides a radio frequency (RF) device calibration method. The method includes: obtaining a measurement result of a channel of a first-stage device under a control condition; obtaining a reference measurement result of a reference channel of a second-stage device, wherein the channel corresponds to the reference channel, and the measurement result and the reference measurement result are measured before the first-stage device and the second-stage device are assembled into an RF device; determining an estimated measurement result corresponding to the channel based on the measurement result and the reference measurement result; obtaining a post-assembly measurement result of the channel of the RF device under the control condition after the first-stage device and the second-stage device are assembled into the RF device; and performing a calibration operation corresponding to the channel based on the estimated measurement result and the post-assembly measurement result.
1 . A radio frequency (RF) device calibration method, comprising:
obtaining a first measurement result (M 1 ) of a first channel of a first-stage device under a first control condition;
obtaining a first reference measurement result (RM 1 ) of a first reference channel of a second-stage device, wherein the first channel corresponds to the first reference channel, and the first measurement result (M 1 ) and the first reference measurement result (RM 1 ) are measured before the first-stage device and the second-stage device are assembled into an RF device ( 10 );
determining a first estimated measurement result (EM 1 ) corresponding to the first channel based on the first measurement result (M 1 ) and the first reference measurement result (RM 1 );
obtaining a first post-assembly measurement result (PM 1 ) of the first channel of the RF device ( 10 ) under the first control condition after the first-stage device and the second-stage device are assembled into the RF device ( 10 ); and
performing a first calibration operation corresponding to the first channel based on the first estimated measurement result (EM 1 ) and the first post-assembly measurement result (PM 1 ).
2 . The method of claim 1 , wherein the first measurement result (M 1 ) comprises a first gain and a first phase of the first channel under the first control condition, and the first reference measurement result comprises a first reference channel gain and a first reference channel phase of the first reference channel.
3 . The method of claim 1 , wherein the step of obtaining the first reference measurement result (RM 1 ) of the first reference channel of the second-stage device comprises:
obtaining a measurement result of the first reference channel of the second-stage device under the first control condition as the first reference measurement result (RM 1 ).
4 . The method of claim 1 , wherein the step of determining the first estimated measurement result (EM 1 ) corresponding to the first channel based on the first measurement result (M 1 ) and the first reference measurement result (RM 1 ) comprises:
obtaining the first estimated measurement result (EM 1 ) corresponding to the first channel by adding the first measurement result (M 1 ) and the first reference measurement result (RM 1 ).
5 . The method of claim 1 , wherein the step of performing the first calibration operation corresponding to the first channel based on the first estimated measurement result (EM 1 ) and the first post-assembly measurement result (PM 1 ) comprises:
obtaining a first comparison result between the first estimated measurement result (EM 1 ) and the first post-assembly measurement result (PM 1 ); and
performing the first calibration operation corresponding to the first channel based on the first comparison result.
6 . The method of claim 5 , wherein the step of obtaining the first comparison result between the first estimated measurement result (EM 1 ) and the first post-assembly measurement result (PM 1 ) comprises:
obtaining a first difference between the first estimated measurement result (EM 1 ) and the first post-assembly measurement result (PM 1 ) as the first comparison result.
7 . The method of claim 1 , further comprising:
obtaining a second measurement result of a second channel of the first-stage device under the first control condition, wherein the second channel corresponds to the first reference channel, and the second measurement result is measured before the first-stage device and the second-stage device are assembled into the RF device ( 10 );
determining a second estimated measurement result corresponding to the second channel based on the second measurement result and the first reference measurement result (RM 1 );
obtaining a second post-assembly measurement result of the second channel of the RF device ( 10 ) under the first control condition after the first-stage device and the second-stage device are assembled into the RF device ( 10 );
performing a second calibration operation corresponding to the second channel based on the second estimated measurement result and the second post-assembly measurement result.
8 . The method of claim 1 , wherein at least one of the first measurement result (M 1 ), the first reference measurement result (RM 1 ), the first estimated measurement result (EM 1 ), and the first post-assembly measurement result (PM 1 ) is recorded into a corresponding table.
9 . The method of claim 1 , wherein the first channel of the first-stage device is configured to connect to a reference channel of the second-stage device when the first-stage device and a second-stage device are assembled into the RF device.