IP Library Granted Patent US 12671913
Granted Patent B2
US 12671913 · App. 18/532,856 · Granted Jun 30, 2026

Semiconductor device for performing light-based computation and operation method of semiconductor device

Inventors: Hyun Soo Kim (Icheon-si, KR); Jeong Hwan Song (Icheon-si, KR); Jun Hwe Cha (Icheon-si, KR); Youn Jae Song (Icheon-si, KR)
Assignee: SK hynix Inc.
H04N25/135H04N23/84H04N25/78
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12671913
App. No.
18/532,856
Granted
Jun 30, 2026
Kind
B2
Abstract

A semiconductor device may include a color filter array, an optical synapse array including a plurality of light passage paths transferring light incident through the color filter array with independently controlled transmissivities, and an optical-to-digital conversion circuit converting the transferred light through the plurality of light passage paths into digital data.

Claims (45)

1 . A semiconductor device comprising:

a color filter array;

an optical synapse array including a plurality of light passage paths, the plurality of light passage paths transferring light incident through the color filter array with independently controlled transmissivities, the transmissivities being determined according to program results of one or more phase change materials included in each of the plurality of light passage paths; and

an optical-to-digital conversion circuit converting the transferred light through the plurality of light passage paths into digital data.

2 . The semiconductor device of claim 1 , wherein the optical-to-digital conversion circuit converts one or more values each obtained by summing the light transferred through specific ones of the plurality of light passage paths into the digital data.

3 . The semiconductor device of claim 2 , wherein each of the plurality of light passage paths of the optical synapse array comprises:

a light guide line transferring the incident light, and

wherein the one or more phase change materials surround an outer wall of the light guide line.

4 . The semiconductor device of claim 3 , wherein each of the one or more phase change materials is programmable, and has a reflectivity adjusted according to a programmed state.

5 . The semiconductor device of claim 4 , wherein a portion of the outer wall of the light guide line that is exposed by the one or more phase change materials is surrounded by a specific material with a reflectivity sufficiently high to cause total reflection between the specific material and the outer wall of the light guide line.

6 . The semiconductor device of claim 4 , wherein each of the one or more phase change materials has one of a crystalline state and an amorphous state according to a program result, and

wherein each of the one or more phase change materials has a first reflectivity when it is in the crystalline state and has a second reflectivity when it is in the amorphous state, the first reflectivity being higher than the second reflectivity.

7 . The semiconductor device of claim 3 , wherein the optical synapse array includes a plurality of word lines and a plurality of bit lines, and

wherein the phase change materials of the plurality of light passage paths are electrically connected between the plurality of word lines and the plurality of bit lines.

8 . The semiconductor device of claim 7 , wherein the phase change materials include a first phase change material connected to a first word line and a first bit line and a second phase change material connected to a second word line and a second bit line, and

wherein the first word line is different from the second word line, or the first bit line is different from the second bit line, or both.

9 . The semiconductor device of claim 8 , wherein an inner surface of the first phase change material is connected to a corresponding light passage path having an end portion connected to the first bit line, and an outer surface of the first phase change material is connected to an inner surface of the first word line.

10 . The semiconductor device of claim 7 , wherein each of the plurality of bit lines extends in a first direction and surrounds end portions of a first group of the light passage paths arranged in the first direction, and

wherein each of the plurality of word lines extends in a second direction intersecting the first direction and surrounds portions of a second group of the light passage paths arranged in the second direction.

11 . The semiconductor device of claim 2 , wherein the optical-to-digital conversion circuit comprises:

a plurality of pixels converting light transferred thereto into voltages, the plurality of pixels corresponding to the plurality of light passage paths in a one-to-one manner;

a plurality of summing circuits summing the voltages of output from the plurality of pixels; and

an analog-to-digital conversion circuit converting the summed voltages into the digital data.

12 . The semiconductor device of claim 11 , wherein each of the plurality of pixels comprises:

a photodiode;

an amplifier amplifying an output voltage of the photodiode;

a resistor having one end connected to an output line; and

a transistor transferring the amplified voltage of the amplifier to the other end of the resistor in response to a level of a select line.

13 . The semiconductor device of claim 11 , wherein each of the summing circuits includes one or more summing amplifiers.

14 . The semiconductor device of claim 2 , wherein the optical-to-digital conversion circuit comprises a plurality of pixels converting light transferred thereto into voltages, and

wherein the specific ones of the plurality of light passage paths are included in each of a plurality of groups, and the plurality of groups are determined based on the plurality of pixels.

15 . The semiconductor device of claim 1 , wherein each of the plurality of light passages paths has a corresponding one of the transmissivities.

16 . An operation method of a semiconductor device, the operation method comprising:

receiving light through a color filter array;

transferring the light received through the color filter array using a plurality of light passage paths, each of the plurality of light passage paths having a programmed transmissivity; and

converting the light transferred through the plurality of light passage paths into digital data,

wherein each of the plurality of light passage paths includes one or more phase change materials, and

wherein transmissivities of the plurality of light passage paths are determined according to program results of the one or more phase change materials.

17 . The operation method of claim 16 , wherein in converting the transferred light into digital data, one or more values each obtained by summing the light transferred through specific ones of the plurality of light passage paths are converted into the digital data.

18 . The operation method of claim 16 , wherein converting the transferred light into digital data comprises:

converting light transferred to the plurality of light passage paths into voltages;

generating summed voltages, each of the summed voltages being obtained by summing specific ones of the converted voltages in each of a plurality of groups; and

generating the digital data by converting the summed voltages from an analog form into a digital form.

19 . The operation method of claim 18 , wherein the plurality of groups are determined based on a plurality of pixels.

20 . The operation method of claim 16 , further comprising, before receiving the light, adjusting a transmissivity of each of the plurality of light passage paths by programming phase change materials included in each of the plurality of light passage paths.