IP Library Granted Patent US 12672425
Granted Patent B2
US 12672425 · App. 18/261,357 · Granted Jun 30, 2026

Light-emitting device and method for manufacturing same, and display substrate and display apparatus

Inventors: Youqin Zhu (Beijing, CN); Dong Li (Beijing, CN); Guangru Li (Beijing, CN)
Assignees: BEIJING BOE TECHNOLOGY DEVELOPMENT CO., LTD.; BOE TECHNOLOGY GROUP CO., LTD.
H10K50/166H10K50/115H10K71/16H10K2102/351
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Quick Facts
Patent No.
US 12672425
App. No.
18/261,357
Granted
Jun 30, 2026
Kind
B2
Abstract

A light-emitting device and a manufacturing method thereof, a display substrate and a display apparatus are provided in the embodiments of the present disclosure. The light-emitting device includes: a first electrode disposed on a base substrate; a quantum dot light-emitting layer disposed at a side of the first electrode away from the base substrate; and an electron transport layer disposed at a side of the quantum dot light-emitting layer close to or away from the first electrode, the electron transport layer including a first transport sub-layer and a second transport sub-layer which are arranged in layer configuration, a material of the first transport sub-layer and a material of the second transport sub-layer both including n-type metal oxides, and an oxygen content of the first transport sub-layer being less than an oxygen content of the second transport sub-layer.

Claims (35)

1 . A light-emitting device, comprising:

a first electrode disposed on a base substrate;

a quantum dot light-emitting layer disposed at a side of the first electrode away from the base substrate; and

an electron transport layer disposed at a side of the quantum dot light-emitting layer close to or away from the first electrode, the electron transport layer comprising a first transport sub-layer and a second transport sub-layer which are arranged in layer configuration, a material of the first transport sub-layer and a material of the second transport sub-layer both comprising n-type metal oxides, and an oxygen content of the first transport sub-layer being less than an oxygen content of the second transport sub-layer.

2 . The light-emitting device according to claim 1 , wherein a thickness of the first transport sub-layer is 2 to 4 times a thickness of the second transport sub-layer.

3 . The light-emitting device according to claim 1 , wherein a total thickness of the electron transport layer is between 5 nm and 150 nm.

4 . The light-emitting device according to claim 1 , wherein the first transport sub-layer is arranged at a side of the quantum dot light-emitting layer away from the base substrate, and the second transport sub-layer is arranged at a side of the first transport sub-layer away from the base substrate.

5 . The light-emitting device according to claim 1 , wherein the first transport sub-layer is arranged between the quantum dot light-emitting layer and the first electrode, and the second transport sub-layer is arranged between the first transport sub-layer and the first electrode.

6 . The light-emitting device according to claim 1 , wherein the light-emitting device further comprises a hole injection layer, a hole transport layer and a second electrode, wherein the first electrode is arranged opposite to the second electrode, the hole injection layer, the hole transport layer, the electron transport layer and the quantum dot light-emitting layer are all arranged between the first electrode and the second electrode, the hole transport layer is arranged at a side of the quantum dot light-emitting layer away from the electron transport layer and the hole injection layer is arranged at a side of the hole transport layer away from the quantum dot light-emitting layer.

7 . The light-emitting device according to claim 1 , wherein the electron transport layer is made of at least one of: zinc oxide, zinc magnesium oxide, gallium doped zinc oxide or aluminum doped zinc oxide.

8 . A display substrate, comprising the light-emitting device according to claim 1 .

9 . A display apparatus, comprising the display substrate according to claim 8 .

10 . The display substrate according to claim 8 , wherein a thickness of the first transport sub-layer is 2 to 4 times a thickness of the second transport sub-layer.

11 . The display substrate according to claim 8 , wherein a total thickness of the electron transport layer is between 5 nm and 150 nm.

12 . The display substrate according to claim 8 , wherein the first transport sub-layer is arranged at a side of the quantum dot light-emitting layer away from the base substrate, and the second transport sub-layer is arranged at a side of the first transport sub-layer away from the base substrate.

13 . A manufacturing method of a light-emitting device, comprising:

forming a first electrode on a base substrate; and

forming an electron transport layer and a quantum dot light-emitting layer respectively, wherein the quantum dot light-emitting layer is arranged at a side of the first electrode away from the base substrate; and the electron transport layer is arranged at a side of the quantum dot light-emitting layer close to or away from the first electrode;

wherein forming the electron transport layer comprises:

forming a first transport sub-layer and a second transport sub-layer respectively through a sputtering process, wherein a material of the first transport sub-layer and a material of the second transport sub-layer both comprises n-type metal oxides; and a sputtering gas in forming the first transport sub-layer comprises an inert gas, and a sputtering gas in forming the second transport sub-layer comprises an inert gas and oxygen.

14 . The manufacturing method according to claim 13 , wherein in forming the second transport sub-layer, a flow of the oxygen is 1% to 30% of a flow of the inert gas.

15 . The manufacturing method according to claim 14 , wherein the flow of the inert gas is between 30 sccm to 60 sccm in forming the second transport sub-layer.

16 . The manufacturing method according to claim 13 , wherein a thickness of the first transport sub-layer is 2 to 4 times a thickness of the second transport sub-layer.

17 . The manufacturing method according to claim 13 , wherein a total thickness of the electron transport layer is between 5 nm and 150 nm.

18 . The manufacturing method according to claim 13 , wherein in forming the first transport sub-layer and the second transport sub-layer, an air pressure in a sputtering chamber is between 0.4 Pa and 1 Pa, and power of a radio frequency source in the sputtering chamber is between 20 W and 150 W.

19 . The manufacturing method according to claim 13 , wherein the step of forming the first transport sub-layer is performed before or after the step of forming the quantum dot light-emitting layer; and

the step of forming the second transport sub-layer is performed after or before the step of forming the first transport sub-layer.

20 . The manufacturing method according to claim 13 , wherein the step of forming the electron transport layer is performed before the step of forming the quantum dot light-emitting layer, and the manufacturing method further comprises:

forming the hole transport layer at a side of the quantum dot light-emitting away from the base substrate;

forming the hole injection layer at a side of the hole transport layer away from the base substrate; and

forming the second electrode at a side of the hole injection layer away from the base substrate; or,

the step of forming the electron transport layer is performed after the step of forming the quantum dot light-emitting layer, and the manufacturing method further comprises:

forming the hole injection layer at the side of the first electrode away from the base substrate;

forming the hole transport layer at the side of the hole injection layer away from the base substrate; and

forming the second electrode at the side of the electron transport layer away from the base substrate.