IP Library Granted Patent US 12672487
Granted Patent B2
US 12672487 · App. 17/809,813 · Granted Jun 30, 2026

High-performance piezoelectric device with piezoelectric element

Inventors: Toshiki Hara (Suwa, JP); Takayuki Yonemura (Suwa, JP); Jiro Kato (Suwa, JP)
Assignee: Seiko Epson Corporation
H10N30/857H10N30/098H10N30/87
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Quick Facts
Patent No.
US 12672487
App. No.
17/809,813
Granted
Jun 30, 2026
Kind
B2
Abstract

A piezoelectric element includes: a piezoelectric body having a first surface and a second surface that are different from each other; a first electrode provided at the first surface; and a second electrode provided at the second surface. The piezoelectric body contains a helical chiral polymer crystal having an orientation axis as a crystal axis, the orientation axis is uniaxially oriented in a manner of intersecting both the first surface and the second surface, and a degree of orientation of the orientation axis in the piezoelectric body is 0.80 or more.

Claims (30)

1 . A piezoelectric element comprising:

a piezoelectric body having a first surface and a second surface, wherein the second surface is different from the first surface;

a first electrode provided at the first surface; and

a second electrode provided at the second surface, wherein

the piezoelectric body contains a polylactic acid crystal,

the polylactic acid crystal has a helical structure and has a unit cell having an a axis, a b axis, and a c axis as crystal axes,

lengths of the crystal axes satisfy a relationship of b axis<a axis<c axis,

the c axis is parallel to an advance axis of the helical structure, and

an orientation axis is the b axis,

the orientation axis is uniaxially oriented in a manner of intersecting both the first surface and the second surface, and

a degree of orientation of the orientation axis in the piezoelectric body is 0.80 or more.

2 . A piezoelectric device comprising:

a substrate,

a support portion, and

the piezoelectric element according to claim 1 .

3 . The piezoelectric element according to claim 1 , wherein when the piezoelectric body is subjected to a θ-2θ measurement by X-ray diffraction and a θ-2θ profile is obtained, the θ-2θ profile has a peak in a range in which a diffraction angle 2θ is 13.5° or more and less than 15.5°.

4 . A piezoelectric device comprising:

a substrate,

a support portion, and

the piezoelectric element according to claim 3 .

5 . The piezoelectric element according to claim 1 , wherein the piezoelectric body is an injection molded body.

6 . A piezoelectric device comprising:

a substrate,

a support portion, and

the piezoelectric element according to claim 5 .

7 . The piezoelectric element according to claim 3 , wherein the piezoelectric body is an injection molded body.

8 . A piezoelectric device comprising:

a substrate,

a support portion, and

the piezoelectric element according to claim 7 .