Multiple tile motherboard tester
A tester board system that includes a frame upon which a plurality of motherboards can be inserted for the purposes of BI and other types of component testing. Each motherboard has memory channels that can accommodate a plurality of memory components for testing, and the memory channels are connected to a CPU. In preferred embodiments, the CPU is on the underside of the motherboard and the memory channels on the top side of the motherboard.
1 . A tester board system, comprising:
at least two motherboards;
a frame dimensioned to receive the at least two motherboards, the frame including corresponding at least two cavities that receive the at least two motherboards; and
each of the at least two motherboards comprising at least one memory channel on a first side and at least one CPU on a second side, wherein the at least one memory channel is communicatively coupled with the at least one CPU;
wherein the at least two motherboards are aligned along a horizontal plane when installed on the frame; and
wherein the at least two motherboards are aligned when installed on the frame such that a lateral edge of a first motherboard contacts a lateral edge of a second motherboard such that the contact between the lateral edge of the first motherboard and the lateral edge of the second motherboard creates at least one of a continuous surface or a near-continuous surface without gaps between the first motherboard and the second motherboard, such that an underside of the first motherboard and underside of the second motherboard is thermally isolated from an upper side of the first motherboard and second motherboard when heat is applied to the upper side of the first motherboard and second motherboard.
2 . The tester board system of claim 1 , wherein the frame is made of a metal or a carbon composite.
3 . The tester board system of claim 2 , wherein the metal comprises aluminum.
4 . The tester board system of claim 1 , wherein the frame is dimensioned to receive between four and ten motherboards.
5 . The tester board system of claim 4 , wherein the motherboards are identical.
6 . The tester board system of claim 1 , wherein the horizontal plane comprises a size of between 30 cm×30 cm and 2 m×2 m.
7 . The tester board system of claim 1 , wherein the frame further comprises an electrical connector configured to couple with a corresponding electrical connector of the at least two motherboards.
8 . The tester board system of claim 7 , wherein the electrical connector comprises at least two electrical connectors, each of the at least two electrical connectors configured to couple with a corresponding electrical connector of each of the at least two motherboards.
9 . The tester board system of claim 1 , wherein each of the at least one memory channel comprises a memory module slot configured to receive a memory module or a memory component slot configured to receive a memory component.
10 . The tester board system of claim 9 , wherein the memory module slot or the memory component slot are arranged on the motherboard such that an inserted memory module or memory component is aligned horizontally with the motherboard.
11 . The tester board system of claim 1 , further comprising a microclimate chamber dimensioned to be positioned over at least a portion of the frame, such that when the at least two motherboards are installed on the frame, the microclimate chamber covers the at least one of the continuous surface or the near-continuous surface without gaps on the first side of each of the at least two motherboards.
12 . The tester board system of claim 11 , wherein the microclimate chamber is dimensioned to cover the entirety of the at least one of the continuous surface or the near-continuous surface without gaps.