Read threshold management using page type

1 . A system comprising:

a set of memory components; and

at least one processing device, operatively coupled to the set of memory components, programmed to perform operations comprising:

selecting a group of memory blocks stored in the set of memory components;

determining that the group of memory blocks is associated with a current bin of a plurality of bins, each bin of the plurality of bins comprising a respective plurality of read threshold offsets;

sampling data stored in the group of memory blocks across different page types using the current bin; and

based on sampling the data, associating the different page types of the group of memory blocks with respective pointers to different bins of the plurality of bins for subsequently reading data from the group of memory blocks, the associating of the different page types with the respective pointers being performed at least in part by:

selecting a first bin based on a first set of samples generated based on data read from one or more pages of a first page type across one or more blocks; and

reading a first set of data stored in a second page type across different pages and different memory blocks using the first bin to compute a first set of bit error rate (BER) samples and reading a second set of data stored in the second page type across the different pages and the different memory blocks using a second bin that is adjacent to the first bin to compute a second set of (BER) samples.

2 . The system of claim 1 , the operations comprising:

associating a first page type of the group of memory blocks with a first pointer corresponding to the first bin of the plurality of bins; and

associating a second page type for the group of memory blocks with a second pointer corresponding to the second bin of the plurality of bins.

3 . The system of claim 1 , wherein the different page types comprise a lower page (LP), an upper page (UP), and extra page (XP), and wherein the plurality of bins comprises block family error avoidance (BFEA) bins.

4 . The system of claim 1 , the operations comprising:

storing a block family error avoidance (BFEA) bin table comprising the plurality of bins, the BFEA bin table comprising a plurality of levels of a tri-level cell (TLC) page, a first set of bins comprising a first set of read threshold offsets for each of the plurality of levels, and a second of bins comprising a second set of read threshold offsets for each of the plurality of levels.

5 . The system of claim 4 , the operations comprising:

reading a plurality of pages across a plurality of blocks in the group of memory blocks using the current bin to generate a plurality of samples;

measuring slow charge loss (SCL) movement for each of the plurality of samples on a first page type to generate a first set of samples; and

measuring SCL movement for each of the plurality of samples on a second page type to generate a second set of samples.

6 . The system of claim 5 , the operations comprising:

computing a first average of the first set of samples;

selecting, as the first bin, a first BFEA bin from the BFEA bin table based on the first average; and

associating the first page type of the group of memory blocks with the first BFEA bin using a first pointer.

7 . The system of claim 6 , the operations comprising:

computing a second average of the second set of samples;

selecting, as the second bin, a second BFEA bin from the BFEA bin table based on the second average; and

associating the second page type of the group of memory blocks with the second BFEA bin using a second pointer.

8 . The system of claim 7 , wherein the first page type corresponds to level 5 of the plurality of levels, and wherein the second page type corresponds to levels greater than level 5 of the plurality of levels.

9 . The system of claim 5 , wherein the plurality of samples is generated from reading three pages across three memory blocks on an individual word line group (WLG).

10 . The system of claim 4 , the operations comprising:

reading one or more of pages of the first page type across the one or more blocks in the group of memory blocks using the current bin to generate one or more samples;

measuring slow charge loss (SCL) movement for each of the one or more samples on the first page type to generate a first set of samples;

selecting, as the first bin, a first BFEA bin from the BFEA bin table based on the first set of samples;

computing BER information based on the first BFEA bin; and

associating the different page types of the group of memory blocks with the respective pointers based on the BER information.

11 . The system of claim 1 , the operations comprising:

reading multiple samples from the first page type using the first bin and the second bin, adjacent to the first bin, from the plurality of bins, wherein for each sample an BER is computed for each of the first bin and the second bin;

identifying, for each individual sample, which bin between the first bin and the second bin resulted in a lowest BER; and

selecting a bin for the first page type based on which bin was identified as having the lowest BER across a majority of the samples.

12 . The system of claim 1 , the operations comprising:

selecting a best bin for the second page type using the first set of BER samples and the second set of BER samples.

13 . The system of claim 12 , wherein the first bin is a first block family error avoidance (BFEA) bin, and the second bin is a second BFEA bin, the operations comprising:

for a first read portion of the different pages and the different memory blocks, selecting a first best BFEA bin by comparing an individual sample of the first set of BER samples with an individual sample of the second set of BER samples to identify which is associated with a lower BER; and

for a second read portion of the different pages and the different memory blocks, selecting a second best BFEA bin by comparing another individual sample of the first set of BER samples with another individual sample of the second set of BER samples to identify which is associated with the lower BER.

14 . The system of claim 12 , wherein the first bin is a first block family error avoidance (BFEA) bin, and the second bin is a second BFEA bin, the operations comprising:

for each read portion of the different pages and the different memory blocks, selecting a best BFEA bin by comparing an individual sample of the first set of BER samples with an individual sample of the second set of BER samples to identify which is associated with a lower BER.

15 . The system of claim 14 , the operations comprising:

determining that the best BFEA bin of a majority of the read portions of the different pages and the different memory blocks comprises the second BFEA bin; and

in response to determining that the best BFEA bin of the majority of the read portions of the different pages and the different memory blocks comprises the second BFEA bin, associating the second page type for the group of memory blocks with the second BFEA bin using a first pointer.

16 . The system of claim 12 , wherein the first bin is a first block family error avoidance (BFEA) bin, and the second bin is a second BFEA bin, the operations comprising:

reading a third set of data stored in a third page type across different pages and different memory blocks in the group of memory blocks using the first BFEA bin to compute a third set of the BER samples;

reading a fourth set of data stored in the third page type across the different pages and the different memory blocks in the group of memory blocks using the second BFEA bin that is adjacent to the first BFEA bin to compute a fourth set of the BER samples;

for each read portion of the different pages and the different memory blocks of the third page type, selecting a best BFEA bin by comparing an individual sample of the third set of BER samples with an individual sample of the fourth set of BER samples to identify which is associated with a lower BER;

determining, for the third page type, that the best BFEA bin of a majority of the read portions of the different pages and the different memory blocks comprises the first BFEA bin; and

in response to determining that the best BFEA bin of the majority of the read portions of the different pages and the different memory blocks comprises the first BFEA bin, associating the second page type for the group of memory blocks with the first BFEA bin using a second pointer.

17 . The system of claim 12 , wherein the first bin is a first block family error avoidance (BFEA) bin, and the second bin is a second BFEA bin, the operations comprising:

determining that the second set of BER samples for the second page type corresponds to a lower BER than the first set of BER samples; and

in response to determining that the second set of BER samples for the second page type corresponds to the lower BER than the first set of BER samples, associating the second page type for the group of memory blocks with the second BFEA bin.

18 . The system of claim 1 , wherein a plurality of samples is generated from reading three pages across three memory blocks on an individual word line group (WLG), the first set of samples forming a portion of the plurality of samples.

19 . A method comprising:

selecting a group of memory blocks stored in a set of memory components;

determining that the group of memory blocks is associated with a current bin of a plurality of bins, each bin of the plurality of bins comprising a respective plurality of read threshold offsets;

sampling data stored in the group of memory blocks across different page types using the current bin; and

based on sampling the data, associating the different page types of the group of memory blocks with respective pointers to different bins of the plurality of bins for subsequently reading data from the group of memory blocks, the associating of the different page types with the respective pointers being performed at least in part by:

selecting a first bin based on a first set of samples generated based on data read from one or more pages of a first page type across one or more blocks; and

reading a first set of data stored in a second page type across different pages and different memory blocks using the first bin to compute a first set of read bit error rate (RBER) samples and reading a second set of data stored in the second page type across the different pages and the different memory blocks using a second bin that is adjacent to the first bin to compute a second set of RBER samples.

20 . A non-transitory computer-readable storage medium comprising instructions that, when executed by at least one processing device, cause the at least one processing device to perform operations comprising:

selecting a group of memory blocks stored in a set of memory components;

determining that the group of memory blocks is associated with a current bin of a plurality of bins, each bin of the plurality of bins comprising a respective plurality of read threshold offsets;

sampling data stored in the group of memory blocks across different page types using the current bin; and

based on sampling the data, associating the different page types of the group of memory blocks with respective pointers to different bins of the plurality of bins for subsequently reading data from the group of memory blocks, the associating of the different page types with the respective pointers being performed at least in part by:

selecting a first bin based on a first set of samples generated based on data read from one or more pages of a first page type across one or more blocks; and

reading a first set of data stored in a second page type across different pages and different memory blocks using the first bin to compute a first set of read bit error rate (RBER) samples and reading a second set of data stored in the second page type across the different pages and the different memory blocks using a second bin that is adjacent to the first bin to compute a second set of RBER samples.